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Second order reflection from crystals used in soft X-ray spectroscopy Cover

Second order reflection from crystals used in soft X-ray spectroscopy

Nukleonika
Volume 60 (2015): Issue 2 (June 2015)
By:   
Open Access
|Jun 2015
References

References

  1. 1. Burek, A. J., Barrus, D. M., & Blake, R. L. (1974). Spectrometric properties of crystals for X-ray astronomy.,, 533–543.
    Open DOISearch in Google Scholar
  2. 2. McKenzie, D. L., Landecker, P. B., & Underwood, J. H. (1976). Crystals and collimators for X-ray spectrometry..,, 125–139.
    Search in Google Scholar
  3. 3. Der, R. C., Boster, T. A., Cunningham, M. E., Fortner, R. J., Kavanagh, T. M., & Khan, J. M. (1970). A small Bragg diffraction spectrometer..,, 1797–1800.
    Open DOISearch in Google Scholar
  4. 4. Levis, M. (1982).. Doctoral dissertation, University of Leicester, United Kingdom.
    Search in Google Scholar
DOI: https://doi.org/10.1515/nuka-2015-0046 | Journal eISSN: 1508-5791 (formerly 0029-5922) | Journal ISSN: 0029-5922
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Language: English
Page range: 263 - 265
Submitted on: May 12, 2014
Accepted on: Oct 5, 2014
Published on: Jun 22, 2015
Published by: Institute of Nuclear Chemistry and Technology
In partnership with: Paradigm Publishing Services
Keywords:
soft X-ray,
plasma spectroscopy,
PbSt,
KAP
Related subjects:
Chemistry,
Nuclear chemistry

© 2015 Ireneusz Książek, published by Institute of Nuclear Chemistry and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 60 (2015): Issue 2 (June 2015)
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