Second order reflection from crystals used in soft X-ray spectroscopy
References
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Language: English
Page range: 263 - 265
Submitted on: May 12, 2014
Accepted on: Oct 5, 2014
Published on: Jun 22, 2015
Published by: Institute of Nuclear Chemistry and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2015 Ireneusz Książek, published by Institute of Nuclear Chemistry and Technology
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