Second order reflection from crystals used in soft X-ray spectroscopy
Language: English
Page range: 263 - 265
Submitted on: May 12, 2014
Accepted on: Oct 5, 2014
Published on: Jun 22, 2015
Published by: Institute of Nuclear Chemistry and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Related subjects:
© 2015 Ireneusz Książek, published by Institute of Nuclear Chemistry and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.