Authors
Hongli Li
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Shenzhen Engineering Laboratory of Geometry Measurement Technology, Graduate School at Shenzhen, Tsinghua University, Shenzhen, China
Xiaohuai Chen
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Yinbao Cheng
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Houde Liu
Shenzhen Engineering Laboratory of Geometry Measurement Technology, Graduate School at Shenzhen, Tsinghua University, Shenzhen, China
Hanbin Wang
Fujian Metrology Institute, Fuzhou, China
Zhenying Cheng
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Hongtao Wang
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China