Uncertainty Modeling and Evaluation of CMM Task Oriented Measurement Based on SVCMM
Authors
Hongli Li
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Shenzhen Engineering Laboratory of Geometry Measurement Technology, Graduate School at Shenzhen, Tsinghua University, Shenzhen, China
Xiaohuai Chen
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Yinbao Cheng
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Houde Liu
Shenzhen Engineering Laboratory of Geometry Measurement Technology, Graduate School at Shenzhen, Tsinghua University, Shenzhen, China
Hanbin Wang
Fujian Metrology Institute, Fuzhou, China
Zhenying Cheng
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
Hongtao Wang
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China
DOI: https://doi.org/10.1515/msr-2017-0027 | Journal eISSN: 1335-8871
Language: English
Page range: 226 - 231
Submitted on: Jul 27, 2017
Accepted on: Sep 22, 2017
Published on: Oct 23, 2017
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Related subjects:
© 2017 Hongli Li, Xiaohuai Chen, Yinbao Cheng, Houde Liu, Hanbin Wang, Zhenying Cheng, Hongtao Wang, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.