Automatic Parameter Extraction Technique for MOS Structures by C-V Characterization Including the Effects of Interface States
By: D. V. Ryazantsev and V. P. Grudtsov
DOI: https://doi.org/10.1515/msr-2016-0033 | Journal eISSN: 1335-8871
Language: English
Page range: 266 - 272
Submitted on: Mar 2, 2016
Accepted on: Oct 6, 2016
Published on: Oct 26, 2016
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2016 D. V. Ryazantsev, V. P. Grudtsov, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.