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Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry Cover

Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry

Measurement Science Review
Volume 15 (2015): Issue 5 (October 2015)
By: ,  ,  ,  ,   and    
Open Access
|Oct 2015
References

References

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DOI: https://doi.org/10.1515/msr-2015-0036 | Journal eISSN: 1335-8871
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Language: English
Page range: 263 - 267
Submitted on: Mar 31, 2015
Accepted on: Oct 7, 2015
Published on: Oct 29, 2015
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Nanometrology,
interferometry,
refractive index of air
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2015 Miroslava Holá, Jan Hrabina, Martin Sarbort, Jindrich Oulehla, Ondrej Cíp, Josef Lazar, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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