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Preparation and spectroscopic analysis of zinc oxide nanorod thin films of different thicknesses Cover

Preparation and spectroscopic analysis of zinc oxide nanorod thin films of different thicknesses

Open Access
|Oct 2017

References

  1. [1] WAHAB H.A., SALAMA A.A., EL-SAEID A.A., NUR O., WILLANDER M., BATTISHA I.K., Results Phys., 3 (2013), 46.10.1016/j.rinp.2013.01.005
  2. [2] KHUN K., IBUPOTO Z.H., CHEY C.O., LU J., NUR O., WILLANDER M., Appl. Surf. Sci., 268 (2013), 37.10.1016/j.apsusc.2012.11.141
  3. [3] ZHOU H., LI J., BAO S., LI J., LIU X., JIN P., Appl. Surf. Sci., 363 (2015), 532.10.1016/j.apsusc.2015.12.045
  4. [4] JANOTTI A., WALLE C.G.V., Rep. Prog. Phys., 72 (2009), 126501.10.1088/0034-4885/72/12/126501
  5. [5] ALI M.M., J. Basrah Res., 37 (2011), 49.
  6. [6] KOŁODZIEJCZAK-RADZIMSKA A., JESIONOWSKI T., Materials, 7 (2014), 2833.10.3390/ma7042833545336428788596
  7. [7] ÖZGÜR Ü., ALIVOV Y.I., LIU C., TEKE A., RESHCHIKOV M.A., DO˘G AN S., AVRUTIN V., CHO S.J., MORKOÇD H., J. Appl. Phys., 98 (2005), 041301.10.1063/1.1992666
  8. [8] BARUAH S., DUTTA J., Sci. Technol. Adv. Mat., 10 (2009), 13001.10.1088/1468-6996/10/1/013001510959727877250
  9. [9] DAS R., KUMAR A., KUMAR Y., SEN S., SHIRAGE P.M., RSC Adv., 5 (2015), 60365.10.1039/C5RA07135F
  10. [10] SKOMPSKA M., ZAREBSKA K., Electrochim. Acta, 127 (2014), 467.10.1016/j.electacta.2014.02.049
  11. [11] MORTEZAALI A., TAHERI O., HOSSEINI Z.S., Microelectron. Eng., 151 (2016), 19.10.1016/j.mee.2015.11.016
  12. [12] SANGARI N.U., DEVI S.C., J. Solid State Chem., 197 (2013), 483.10.1016/j.jssc.2012.08.011
  13. [13] MARIAPPAN R., PONNUSWAMY V., CHANDRA BOSE A., CHITHAMBARARAJ A., SURESH R., RAGAVENDAR M., Superlattice. Microst., 65 (2014), 184.10.1016/j.spmi.2013.10.005
  14. [14] SHARMA M., MEHRA R.M., Appl. Surf. Sci., 255 (2008), 252710.1016/j.apsusc.2008.07.153
  15. [15] ZHONG B.Z., FANG G.J., WANG J.F., GUAN W.J., ZHAO X.Z., J. Appl. Phys., 101 (2007), 033713.10.1063/1.2437572
  16. [16] MORTEZAALI A., TAHERI O., HOSSEINI Z.S., Microelectron. Eng., 151 (2016), 19.10.1016/j.mee.2015.11.016
  17. [17] ZHANG S., YAN C., ZHANG H., LU G., Mater. Lett., 148 (2015), 1.10.1016/j.matlet.2015.02.050
  18. [18] XU L., LI X., CHEN Y., XU F., Appl. Surf. Sci., 257 (2011), 4031.10.1016/j.apsusc.2010.11.170
  19. [19] FARHAT O.F., HALIM M.M., ABDULLAH M.J., ALI M.K.M., ALLAM N.K., Beilstein J. Nanotech., 6 (2015), 720.10.3762/bjnano.6.73436198825821712
  20. [20] KASHIF M., HASHIM U., ALI M.E., ALI S.M.U., RUSOP M., IBUPOTO Z.H., WILLANDER M., J. Nanomater., 2012 (2012), 452407.10.1155/2012/452407
  21. [21] FOO K.L., HASHIM U., MUHAMMAD K., VOON C.H., Nanoscale Res. Lett., 9 (2014), 429.10.1186/1556-276X-9-429415002425221458
  22. [22] MARIAPPAN R., PONNUSWAMY V., BOSE A.C., CHITHAMBARARAJ A., SURESH R., RAGAVENDAR M., Superlattice Microst., 65 (2014), 184.10.1016/j.spmi.2013.10.005
  23. [23] SRINIVASAN G., KUMAR R.T.R., KUMAR J., J. Sol- Gel Sci. Techn., 43 (2007), 171.10.1007/s10971-007-1574-2
  24. [24] MORKOC H., Handbook of Nitride Semiconductors and Devices: Materials Properties, Physics and Growth, Vol. 1, John Wiley & Sons, New Jersey, 2009.10.1002/9783527628438
  25. [25] ROZA L., RAHMAN M.Y.A., UMAR A.A., SALLEH M.M., J. Alloy. Compd., 618 (2015), 153.10.1016/j.jallcom.2014.08.113
  26. [26] JI L.W., PENG S.M., SU Y.K., YOUNG S.J., WU C.Z., CHENG W.B., Appl. Phys. Lett., 94 (2009), 203106.10.1063/1.3141447
  27. [27] CAGLAR M., CAGLAR Y., ILICAN S., J. Optoelectron. Adv. M., 8 (2006), 1410.
  28. [28] BOROWICZ P.B., J. Spectrosc., 2016 (2016), 1617063.
  29. [29] GUPTA R.K., SERBETI Z., YAKUPHANOGLU F., J. Alloy. Compd., 515 (2012), 96.10.1016/j.jallcom.2011.11.098
  30. [30] RAI R.C., J. Appl. Phys., 113 (2013), 153508.10.1063/1.4801900
  31. [31] GADALLAH A.S., EL-NAHASS M.M., Condens. Matter Phys., 2013 (2013), 234546.10.1155/2013/234546
  32. [32] KHAN M.F., ANSARI A.H., HAMEEDULLAH M., AHMAD E., HUSAIN F.M., ZIA Q., BAIG U., ZAHEER M.R., ALAM M.M., KHAN A.M., ALOTHMAN Z.A., AHMAD I., ASHRAF G.M., ALIEV G., Sci. Rep.-UK, 6 (2016), 27689.10.1038/srep27689492388127349836
  33. [33] XUA L., LI X., CHEN Y., XU F., Appl. Surf. Sci., 257 (2011), 4031.10.1016/j.apsusc.2010.11.170
  34. [34] ZHANG D., FAN P., CAI X., HUANG J., RU L., ZHENG Z., LIANG G., HUANG Y., Appl. Phys. A, 97 (2009), 437.10.1007/s00339-009-5234-y
  35. [35] NOEI H., QIU H., WANG Y., LÖFFLER E., WÖLLB C., MUHLER M., Phys. Chem. Chem. Phys., 10 (2008), 7092.10.1039/b811029h19039343
  36. [36] CHENG X.L., ZHAO H., HUO H., GAO S., ZHAO J.G., Sensor. Actuat. B-Chem., 102 (2004), 248.10.1016/j.snb.2004.04.080
  37. [37] VIJAYALAKSHMI K., KARTHICK K., GOPALAKRISHNA D., Ceram. Int., 39 (2013), 4749.10.1016/j.ceramint.2012.11.061
  38. [38] JIN F., ZENG X., LIU J., JIN Y., WANG L., ZHONG H., YAO G., HUO Z., Sci. Rep.-UK, 4 (2014), 4503.10.1038/srep04503396848624675820
  39. [39] TÜZEMEN E. ¸S., EKER S., KAVAK H., ESEN R., Appl. Surf. Sci., 255 (2009), 6195.10.1016/j.apsusc.2009.01.078
  40. [40] LEE J., SORESCU D.C., DENG X., J. Phys. Chem. Lett., 7 (2016), 1335.10.1021/acs.jpclett.6b0043227003692
  41. [41] BELAHSSENA O., TEMAM H.B., LAKEL S., BENHAOUA B., BENRAMACHE S., GAREH S., Optik, 126 (2015), 1487.10.1016/j.ijleo.2015.04.010
DOI: https://doi.org/10.1515/msp-2017-0066 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 501 - 510
Submitted on: Oct 19, 2016
Accepted on: Aug 13, 2017
Published on: Oct 31, 2017
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2017 Nasrul Haque Mia, Sardar Masud Rana, Firoz Pervez, Mohammad Reefaz Rahman, Khalid Hossain, Abdul Al Mortuza, Mohammad Khairul Basher, Mahbubul Hoq, published by Wroclaw University of Science and Technology
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