Preparation and spectroscopic analysis of zinc oxide nanorod thin films of different thicknesses

Mia, Nasrul Haque; Rana, Sardar Masud; Pervez, Firoz; Rahman, Mohammad Reefaz; Hossain, Khalid; Mortuza, Abdul Al; Basher, Mohammad Khairul; Hoq, Mahbubul

doi:10.1515/msp-2017-0066

Abstract

Zinc oxide thin films with different thicknesses were prepared on microscopic glass slides by sol-gel spin coating method, then hydrothermal process was applied to produce zinc oxide nanorod arrays. The nanorod thin films were characterized by various spectroscopic methods of analysis. From the images of field emission scanning electron microscope (FESEM), it was observed that for the film thickness up to 200 nm the formed nanorods with wurtzite hexagonal structure were uniformly distributed over the entire surface substrate. From X-ray diffraction analysis it was revealed that the thin films had good polycrystalline nature with highly preferred c-axis orientation along (0 0 2) plane. The optical characterization done by UV-Vis spectrometer showed that all the films had high transparency of 83 % to 96 % in the visible region and sharp cut off at ultraviolet region of electromagnetic spectrum. The band gap of the films decreased as their thickness increased. Energy dispersive X-ray spectroscopy (EDS) showed the presence of zinc and oxygen elements in the films and Fourier transform infrared spectroscopy (FT-IR) revealed the chemical composition of ZnO in the film.

References

[1] WAHAB H.A., SALAMA A.A., EL-SAEID A.A., NUR O., WILLANDER M., BATTISHA I.K., Results Phys., 3 (2013), 46.10.1016/j.rinp.2013.01.005
Search in Google Scholar Back to article
[2] KHUN K., IBUPOTO Z.H., CHEY C.O., LU J., NUR O., WILLANDER M., Appl. Surf. Sci., 268 (2013), 37.10.1016/j.apsusc.2012.11.141
Search in Google Scholar Back to article
[3] ZHOU H., LI J., BAO S., LI J., LIU X., JIN P., Appl. Surf. Sci., 363 (2015), 532.10.1016/j.apsusc.2015.12.045
Search in Google Scholar Back to article
[4] JANOTTI A., WALLE C.G.V., Rep. Prog. Phys., 72 (2009), 126501.10.1088/0034-4885/72/12/126501
Search in Google Scholar Back to article
[5] ALI M.M., J. Basrah Res., 37 (2011), 49.
Search in Google Scholar Back to article
[6] KOŁODZIEJCZAK-RADZIMSKA A., JESIONOWSKI T., Materials, 7 (2014), 2833.10.3390/ma7042833545336428788596
Search in Google Scholar Back to article
[7] ÖZGÜR Ü., ALIVOV Y.I., LIU C., TEKE A., RESHCHIKOV M.A., DO˘G AN S., AVRUTIN V., CHO S.J., MORKOÇD H., J. Appl. Phys., 98 (2005), 041301.10.1063/1.1992666
Search in Google Scholar Back to article
[8] BARUAH S., DUTTA J., Sci. Technol. Adv. Mat., 10 (2009), 13001.10.1088/1468-6996/10/1/013001510959727877250
Search in Google Scholar Back to article
[9] DAS R., KUMAR A., KUMAR Y., SEN S., SHIRAGE P.M., RSC Adv., 5 (2015), 60365.10.1039/C5RA07135F
Search in Google Scholar Back to article
[10] SKOMPSKA M., ZAREBSKA K., Electrochim. Acta, 127 (2014), 467.10.1016/j.electacta.2014.02.049
Search in Google Scholar Back to article
[11] MORTEZAALI A., TAHERI O., HOSSEINI Z.S., Microelectron. Eng., 151 (2016), 19.10.1016/j.mee.2015.11.016
Search in Google Scholar Back to article
[12] SANGARI N.U., DEVI S.C., J. Solid State Chem., 197 (2013), 483.10.1016/j.jssc.2012.08.011
Search in Google Scholar Back to article
[13] MARIAPPAN R., PONNUSWAMY V., CHANDRA BOSE A., CHITHAMBARARAJ A., SURESH R., RAGAVENDAR M., Superlattice. Microst., 65 (2014), 184.10.1016/j.spmi.2013.10.005
Open DOI Search in Google Scholar Back to article
[14] SHARMA M., MEHRA R.M., Appl. Surf. Sci., 255 (2008), 252710.1016/j.apsusc.2008.07.153
Search in Google Scholar Back to article
[15] ZHONG B.Z., FANG G.J., WANG J.F., GUAN W.J., ZHAO X.Z., J. Appl. Phys., 101 (2007), 033713.10.1063/1.2437572
Search in Google Scholar Back to article
[16] MORTEZAALI A., TAHERI O., HOSSEINI Z.S., Microelectron. Eng., 151 (2016), 19.10.1016/j.mee.2015.11.016
Search in Google Scholar Back to article
[17] ZHANG S., YAN C., ZHANG H., LU G., Mater. Lett., 148 (2015), 1.10.1016/j.matlet.2015.02.050
Search in Google Scholar Back to article
[18] XU L., LI X., CHEN Y., XU F., Appl. Surf. Sci., 257 (2011), 4031.10.1016/j.apsusc.2010.11.170
Search in Google Scholar Back to article
[19] FARHAT O.F., HALIM M.M., ABDULLAH M.J., ALI M.K.M., ALLAM N.K., Beilstein J. Nanotech., 6 (2015), 720.10.3762/bjnano.6.73436198825821712
Search in Google Scholar Back to article
[20] KASHIF M., HASHIM U., ALI M.E., ALI S.M.U., RUSOP M., IBUPOTO Z.H., WILLANDER M., J. Nanomater., 2012 (2012), 452407.10.1155/2012/452407
Search in Google Scholar Back to article
[21] FOO K.L., HASHIM U., MUHAMMAD K., VOON C.H., Nanoscale Res. Lett., 9 (2014), 429.10.1186/1556-276X-9-429415002425221458
Search in Google Scholar Back to article
[22] MARIAPPAN R., PONNUSWAMY V., BOSE A.C., CHITHAMBARARAJ A., SURESH R., RAGAVENDAR M., Superlattice Microst., 65 (2014), 184.10.1016/j.spmi.2013.10.005
Open DOI Search in Google Scholar Back to article
[23] SRINIVASAN G., KUMAR R.T.R., KUMAR J., J. Sol- Gel Sci. Techn., 43 (2007), 171.10.1007/s10971-007-1574-2
Open DOI Search in Google Scholar Back to article
[24] MORKOC H., Handbook of Nitride Semiconductors and Devices: Materials Properties, Physics and Growth, Vol. 1, John Wiley & Sons, New Jersey, 2009.10.1002/9783527628438
Search in Google Scholar Back to article
[25] ROZA L., RAHMAN M.Y.A., UMAR A.A., SALLEH M.M., J. Alloy. Compd., 618 (2015), 153.10.1016/j.jallcom.2014.08.113
Search in Google Scholar Back to article
[26] JI L.W., PENG S.M., SU Y.K., YOUNG S.J., WU C.Z., CHENG W.B., Appl. Phys. Lett., 94 (2009), 203106.10.1063/1.3141447
Search in Google Scholar Back to article
[27] CAGLAR M., CAGLAR Y., ILICAN S., J. Optoelectron. Adv. M., 8 (2006), 1410.
Search in Google Scholar Back to article
[28] BOROWICZ P.B., J. Spectrosc., 2016 (2016), 1617063.
Search in Google Scholar Back to article
[29] GUPTA R.K., SERBETI Z., YAKUPHANOGLU F., J. Alloy. Compd., 515 (2012), 96.10.1016/j.jallcom.2011.11.098
Search in Google Scholar Back to article
[30] RAI R.C., J. Appl. Phys., 113 (2013), 153508.10.1063/1.4801900
Search in Google Scholar Back to article
[31] GADALLAH A.S., EL-NAHASS M.M., Condens. Matter Phys., 2013 (2013), 234546.10.1155/2013/234546
Search in Google Scholar Back to article
[32] KHAN M.F., ANSARI A.H., HAMEEDULLAH M., AHMAD E., HUSAIN F.M., ZIA Q., BAIG U., ZAHEER M.R., ALAM M.M., KHAN A.M., ALOTHMAN Z.A., AHMAD I., ASHRAF G.M., ALIEV G., Sci. Rep.-UK, 6 (2016), 27689.10.1038/srep27689492388127349836
Open DOI Search in Google Scholar Back to article
[33] XUA L., LI X., CHEN Y., XU F., Appl. Surf. Sci., 257 (2011), 4031.10.1016/j.apsusc.2010.11.170
Search in Google Scholar Back to article
[34] ZHANG D., FAN P., CAI X., HUANG J., RU L., ZHENG Z., LIANG G., HUANG Y., Appl. Phys. A, 97 (2009), 437.10.1007/s00339-009-5234-y
Open DOI Search in Google Scholar Back to article
[35] NOEI H., QIU H., WANG Y., LÖFFLER E., WÖLLB C., MUHLER M., Phys. Chem. Chem. Phys., 10 (2008), 7092.10.1039/b811029h19039343
Search in Google Scholar Back to article
[36] CHENG X.L., ZHAO H., HUO H., GAO S., ZHAO J.G., Sensor. Actuat. B-Chem., 102 (2004), 248.10.1016/j.snb.2004.04.080
Search in Google Scholar Back to article
[37] VIJAYALAKSHMI K., KARTHICK K., GOPALAKRISHNA D., Ceram. Int., 39 (2013), 4749.10.1016/j.ceramint.2012.11.061
Search in Google Scholar Back to article
[38] JIN F., ZENG X., LIU J., JIN Y., WANG L., ZHONG H., YAO G., HUO Z., Sci. Rep.-UK, 4 (2014), 4503.10.1038/srep04503396848624675820
Search in Google Scholar Back to article
[39] TÜZEMEN E. ¸S., EKER S., KAVAK H., ESEN R., Appl. Surf. Sci., 255 (2009), 6195.10.1016/j.apsusc.2009.01.078
Search in Google Scholar Back to article
[40] LEE J., SORESCU D.C., DENG X., J. Phys. Chem. Lett., 7 (2016), 1335.10.1021/acs.jpclett.6b0043227003692
Search in Google Scholar Back to article
[41] BELAHSSENA O., TEMAM H.B., LAKEL S., BENHAOUA B., BENRAMACHE S., GAREH S., Optik, 126 (2015), 1487.10.1016/j.ijleo.2015.04.010
Search in Google Scholar Back to article

Preparation and spectroscopic analysis of zinc oxide nanorod thin films of different thicknesses

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