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Optical spectroscopic analysis of annealed Cd1−xZnxSe thin films deposited by close space sublimation technique Cover

Optical spectroscopic analysis of annealed Cd1−xZnxSe thin films deposited by close space sublimation technique

Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
By: Ijaz Ali,  Amjid Iqbal,  Arshad Mahmood,  A. Shah,  M. Zakria and  Asad Ali  
Open Access
|Dec 2016

Authors

Ijaz Ali

Ijazwatoozi@gmail.com

Pakistan

Amjid Iqbal

Pakistan

Arshad Mahmood

Pakistan

A. Shah

Pakistan

M. Zakria

Pakistan

Asad Ali

Pakistan
DOI: https://doi.org/10.1515/msp-2016-0118 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 828 - 833
Submitted on: Apr 16, 2016
|
Accepted on: Oct 17, 2016
|
Published on: Dec 19, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
thin films,
optical constants,
ellipsometry,
CdZnSe,
optical band gap
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 Ijaz Ali, Amjid Iqbal, Arshad Mahmood, A. Shah, M. Zakria, Asad Ali, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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