Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate

Materials Science-Poland

Volume 34 (2016): Issue 3 (September 2016)

By:

R. Skonieczny, P. Popielarski, W. Bała, K. Fabisiak, K. Paprocki, M. Jancelewicz, M. Kowalska and M. Szybowicz

Open Access

|Sep 2016

Download Article

Download the full article as a PDF file.

DOI: https://doi.org/10.1515/msp-2016-0086 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

Journal RSS Feed

Language: English

Page range: 676 - 683

Submitted on: Feb 22, 2016

Accepted on: Jul 9, 2016

Published on: Sep 28, 2016

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 times per year

Keywords:

copper phthalocyanine,

Raman spectroscopy,

molecular orientation,

atomic force microscopy,

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2016 R. Skonieczny, P. Popielarski, W. Bała, K. Fabisiak, K. Paprocki, M. Jancelewicz, M. Kowalska, M. Szybowicz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Previous article Volume 34 (2016): Issue 3 (September 2016)Next article