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Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate Cover

Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate

Materials Science-Poland
Volume 34 (2016): Issue 3 (September 2016)
By: R. Skonieczny,  P. Popielarski,  W. Bała,  K. Fabisiak,  K. Paprocki,  M. Jancelewicz,  M. Kowalska and  M. Szybowicz  
Open Access
|Sep 2016

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DOI: https://doi.org/10.1515/msp-2016-0086 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 676 - 683
Submitted on: Feb 22, 2016
|
Accepted on: Jul 9, 2016
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Published on: Sep 28, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
copper phthalocyanine,
Raman spectroscopy,
molecular orientation,
atomic force microscopy,
heat treatment
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 R. Skonieczny, P. Popielarski, W. Bała, K. Fabisiak, K. Paprocki, M. Jancelewicz, M. Kowalska, M. Szybowicz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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