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High accuracy computational methods for behavioral modeling of thick-film resistors at cryogenic temperatures Cover

High accuracy computational methods for behavioral modeling of thick-film resistors at cryogenic temperatures

Materials Science-Poland
Volume 34 (2016): Issue 1 (March 2016)
By: Franciszek Balik and  Andrzej Dziedzic  
Open Access
|Apr 2016

Authors

Franciszek Balik

franciszek.balik@pwr.edu.pl

Poland

Andrzej Dziedzic

Poland
DOI: https://doi.org/10.1515/msp-2016-0031 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 212 - 225
Submitted on: Mar 9, 2015
Accepted on: Jan 21, 2016
Published on: Apr 27, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
thick-film resistors,
cryogenic temperature,
behavioral modeling
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 Franciszek Balik, Andrzej Dziedzic, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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