Electronic parameters of MIS Schottky diodes with DNA biopolymer interlayer
By: Ömer Güllü and Abdulmecit Türüt
References
- [1] KOEZUKA H., ETOH S., J. Appl. Phys., 54 (5) (1983), 2511.
- [2] KURATA T., KOEZUKA H., TSUNODA S., ANDO T., J. Phys. D Appl. Phys., 19 (4) (1986), L57.
- [3] TURUT A., KOLELI F., J. Appl. Phys., 72 (2) (1992), 818.
- [4] ONGANER Y., SAGLAM M., TURUT A., EFEOGLU H., TUZEMEN S., Solid State Electron., 39 (1996), 677.
- [5] GUPTA R., MISRA S.C.K., MALHOTRA B.D., BELADAKERE N.N., CHANDRA S., Appl. Phys. Lett., 58 (1991), 51.
- [6] AYDOGAN S., SAGLAM M., TURUT A., J. Phys.- Condens. Mat., 18 (9) (2006), 2665.
- [7] CAMAIONI N., CASALBORE-MICELI G., BEGGIATO G., CRISTANI M., SUMMONTE C., Thin Solid Films, 366 (2000), 211.
- [8] FORREST S.R., SCHMIDT P.H., J. Appl. Phys., 59 (1986), 513.
- [9] GULLU O., PAKMA O., TURUT A., J. Appl. Phys., 111 (2012), 044503.
- [10] SAMUEL M., MENON C.S., UNNIKRISHNAN N.V., Mater. Sci.-Poland, 25 (1) (2007), 177.
- [11] KILICOGLU T., AYDIN M.E., OCAK Y.S., Physica B, 388 (1, 2) (2007), 244.
- [12] KAMPEN T., SCHULLER A., ZAHN D.R. T., BIEL B., ORTEGA J., PEREZ R., FLORES F., Appl. Surf. Sci., 234 (2004), 341.
- [13] ZAHN D.R.T., KAMPEN T.U., MENDEZ H., Appl. Surf. Sci., 212 - 213 (2003), 423.
- [14] ROBERTS A.R.V., EVANS D.A., Appl. Phys. Lett., 86 (2005), 072105.
- [15] BOLOGNESI A., CARLO A.D., LUGLI P., KAMPEN T., ZAHN D.R.T., J. Phys.: Condens. Mat., 15 (2003), S2719.
- [16] RAJESH K.R., MENON C.S., J. Non-Cryst. Solids, 353 (4) (2007), 398.
- [17] FORREST S.R., KAPLAN M.L., SCHMIDT P.H., FELDMANN W.L., YANOWSKI E., Appl. Phys. Lett., 41 (1982), 90.
- [18] CAKAR M., TEMIRCI C., TURUT A., Chemphyschem, 8 (2002), 701.
- [19] AYDIN M.E., KILICOGLU T., AKKILIC K., HOSGOREN H., Physica B, 381 (2006), 113.
- [20] FORREST S.R., KAPLAN M.L., SCHMIDT P.H., J. Appl. Phys., 55 (1984), 1492.
- [21] ANTOHE S., TOMOZEIU N., GOGONEA S., Phys. Status Solidi A, 125 (1991), 397.
- [22] EBEOGLU M.A., KILICOGLU T., AYDIN M.E., Physica B, 395 (2007), 93.
- [23] HATTORI K., TORII Y., Solid State Electron., 34 (1991), 527.
- [24] SUGIUO T., SAKAMOTO Y., SUMIGUCHI T., NOMOTO K., SHIRAFUJI J., Jpn. J. Appl. Phys., 32 (1993), L1196.
- [25] SAKAMOTO Y., SUGINO T., MIYAZAKI T., SHIRAFUJI J., Electron. Lett., 31 (1995), 1104.
- [26] GULLU O., TURUT A., Sol. Energ. Mat. Sol. C., 92 (10) (2008), 1295.
- [27] BHALLA V., BAJPAI R. P., BHARADWAJ L.M., EMBO Rep., 4 (5) (2003), 442.
- [28] HWANG J.S., HWANG S.W., AHN D., Superlattice. Microst., 4 (2003), 433.
- [29] PORATH D., BEZRYADIN A., VRIES DE S., DEKKER C., Nature, 403 (2000), 635.
- [30] KASUMOV A.Y., KOCIAK M., GUERON S., REULET B., VOLKOV V.T., KLINOV D.V., BOUCHIAT H., Science, 291 (2001), 280.
- [31] YOO K.H., HA D.H., LEE J.O., PARK J.W., KIM J., KIM J.J., LEE H.Y., KAWAI T., CHOI H.Y., Phys. Rev. Lett., 87 (2001), 198102.
- [32] HWANG J.S., KONG K.J., AHN D., LEE G.S., AHN D.J., HWANG S.W., Appl. Phys. Lett., 81 (2002), 1134.
- [33] LI X.Q., YAN Y., J., Appl. Phys. Lett., 79 (2001), 2190.
- [34] STORM A.J., VAN NOORT J., VRIES DE S., DEKKER C., Appl. Phys. Lett., 79 (2001), 3881.
- [35] CAI L., TABATA H., KAWAI T., Appl. Phys. Lett., 77 (2000), 3105.
- [36] FINK H.W., SCHONENBERGER C., Nature, 398 (1999), 407.
- [37] JO Y.S., LEE Y., ROH Y., Mater. Sci. Eng. C, 23 (2003), 841.
- [38] ENDRES R.G., COX D.L., SINGH R.R.P., Rev. Mod. Phys., 76 (2004), 195.
- [39] KWOK H.L., IET Nanobiotechnol., 151 (6) (2004), 193.
- [40] QIU Y., QIAO J., Thin Solid Films, 372 (2000), 265.
- [41] RHODERICK E.H., WILLIAMS R.H., Metal- Semiconductor Contacts, Clarendon, Oxford, 1988.
- [42] SZE S.M., Physics of Semiconductor Devices, Wiley, New York, 1981.
- [43] SCHMITSDORF R.F., KAMPEN T.U., MONCH W., J. Vac. Sci. Technol. B, 15 (4) (1997), 1221.
- [44] MONCH W., J. Vac. Sci. Technol. B, 17 (4) (1999), 1867.
- [45] TUNG R.T., Phys. Rev. B, 45 (23) (1992), 13509.
- [46] VANALME G.M., GOUBERT L., MEIRHAEGHE VAN R.L., CARDON F., DAELE VAN P., Semicond. Sci.Tech., 14 (1999), 871.
- [47] CAKAR M., TEMIRCI C., TURUT A., Synthetic Met., 142 (2004), 177.
- [48] ZAHN D.R.T., PARK S., KAMPEN T.U., Vacuum, 67 (2002), 101.
- [49] MEIRHAEGHE VAN R.L., LAFLERE W.H., CARDON F., J. Appl. Phys., 76 (1) (1994), 403.
- [50] AYDOGAN S., SAGLAM M., TURUT A., Microelectron. Eng., 85 (2008), 278.
- [51] CHEUNG S.K., CHEUNG N.W., Appl. Phys. Lett., 49 (1986), 85.
- [52] TURUT A., SAGLAM M., EFEOGLU H., YALCIN N., YILDIRIM M., ABAY B., Physica B, 205 (1995), 41.
- [53] KILICOGLU T., Thin Solid Films, 516 (2008), 967.
- [54] KARATAS S., ALTINDAL S., TURUT A., CAKAR M., Physica B, 392 (1 - 2) (2007), 43.
- [55] WERNER J.H., GUTTLER H.H., J. Appl. Phys., 69 (1991), 1522.
- [56] GULLU O., AYDOGAN S., TURUT A., Microelectron.Eng., 85 (2008), 1647.
- [57] CARD H.C., RHODERICK E.H., J. Phys. D Appl. Phys., 4 (1971), 1589.
DOI: https://doi.org/10.1515/msp-2015-0089 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Language: English
Page range: 593 - 600
Submitted on: Dec 27, 2014
Accepted on: Jun 1, 2015
Published on: Aug 30, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
Related subjects:
© 2016 Ömer Güllü, Abdulmecit Türüt, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.