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Studies on Inx(As2Se3)1-x thin films using variable angle spectroscopic ellipsometry (VASE) Cover

Studies on Inx(As2Se3)1-x thin films using variable angle spectroscopic ellipsometry (VASE)

Materials Science-Poland
Volume 33 (2015): Issue 3 (September 2015)
By: G. A. M. Amin  
Open Access
|Aug 2016

References

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DOI: https://doi.org/10.1515/msp-2015-0075 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 501 - 507
Submitted on: Oct 9, 2014
|
Accepted on: Apr 29, 2015
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Published on: Aug 30, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
chalcogenides,
ellipsometry,
optical absorption,
energy gap,
nonlinear optics
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 G. A. M. Amin, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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