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Electric measurements of PV heterojunction structures a-SiC/c-Si Cover

Electric measurements of PV heterojunction structures a-SiC/c-Si

Journal of Electrical Engineering
Volume 69 (2018): Issue 1 (January 2018)
By: Milan Perný,  Vladimír Šály,  František Janíček,  Miroslav Mikolášek,  Michal Váry and  Jozef Huran  
Open Access
|Mar 2018

Authors

Milan Perný

Faculty of Electrical Engineering and Information Technologies, Slovak University of Technology, Bratislava, Slovakia

Vladimír Šály

vladimir.saly@stuba.sk

Faculty of Electrical Engineering and Information Technologies, Slovak University of Technology, Bratislava, Slovakia

František Janíček

Faculty of Electrical Engineering and Information Technologies, Slovak University of Technology, Bratislava, Slovakia

Miroslav Mikolášek

Faculty of Electrical Engineering and Information Technologies, Slovak University of Technology, Bratislava, Slovakia

Michal Váry

Faculty of Electrical Engineering and Information Technologies, Slovak University of Technology, Bratislava, Slovakia

Jozef Huran

jozef.huran@savba.sk

Slovak Academy of Sciences, Institute of Electrical Engineering, Bratislava, Slovakia
DOI: https://doi.org/10.1515/jee-2018-0007 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 52 - 57
Submitted on: Nov 5, 2017
|
Published on: Mar 7, 2018
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
amorphous silicon carbide,
thin films,
solar cell,
impedance spectroscopy,
equivalent circuit
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2018 Milan Perný, Vladimír Šály, František Janíček, Miroslav Mikolášek, Michal Váry, Jozef Huran, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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