Properties of nanocrystalline Si layers embedded in structure of solar cell Cover

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Properties of nanocrystalline Si layers embedded in structure of solar cell

Journal of Electrical Engineering

Volume 68 (2017): Issue 7 (December 2017)

By: Stanislav Jurečka, Kentaro Imamura, Taketoshi Matsumoto and Hikaru Kobayashi

Open Access

|Dec 2017

Authors

Stanislav Jurečka

jurecka@lm.uniza.sk

Institute of Aurel Stodola, University of Žilina, Liptovský Mikuláš, Slovakia

Kentaro Imamura

Institute of Scientific and Industrial Research, Osaka University and CREST, Japan Science and Technology Agency, Osaka, Japan

Taketoshi Matsumoto

Institute of Scientific and Industrial Research, Osaka University and CREST, Japan Science and Technology Agency, Osaka, Japan

Hikaru Kobayashi

Institute of Scientific and Industrial Research, Osaka University and CREST, Japan Science and Technology Agency, Osaka, Japan

DOI: https://doi.org/10.1515/jee-2017-0055 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632

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Language: English

Page range: 48 - 52

Submitted on: Apr 23, 2017

|

Published on: Dec 29, 2017

Published by: Slovak University of Technology in Bratislava

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

Keywords:

silicon solar cell,

microstructure,

Fourier analysis

Related subjects:

Introductions and overviews,

Engineering, other

© 2017 Stanislav Jurečka, Kentaro Imamura, Taketoshi Matsumoto, Hikaru Kobayashi, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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