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VQ-based model for binary error process Cover

VQ-based model for binary error process

Journal of Electrical Engineering
Volume 68 (2017): Issue 3 (May 2017)
By: Tibor Csóka,  Jaroslav Polec,  Filip Csóka and  Kvetoslava Kotuliaková  
Open Access
|Jul 2017

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DOI: https://doi.org/10.1515/jee-2017-0025 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 167 - 179
Submitted on: Aug 3, 2016
Published on: Jul 6, 2017
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
binary error,
VQ,
wireless channel,
logical channel,
error model,
wireless sensor network
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2017 Tibor Csóka, Jaroslav Polec, Filip Csóka, Kvetoslava Kotuliaková, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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