VQ-based model for binary error process Cover

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VQ-based model for binary error process

Journal of Electrical Engineering

Volume 68 (2017): Issue 3 (May 2017)

By: Tibor Csóka, Jaroslav Polec, Filip Csóka and Kvetoslava Kotuliaková

Open Access

|Jul 2017

Authors

Tibor Csóka

csoka@ut.fei.stuba.sk

Institute of Telecommunications, Slovak University of Technology in Bratislava, Bratislava, Slovakia

Jaroslav Polec

polec@ktl.elf.stuba.sk

Institute of Telecommunications, Slovak University of Technology in Bratislava, Bratislava, Slovakia

Filip Csóka

filip.csoka@gmail.com

Institute of Telecommunications, Slovak University of Technology in Bratislava, Bratislava, Slovakia

Kvetoslava Kotuliaková

kkotul@ktl.elf.stuba.sk

Institute of Telecommunications, Slovak University of Technology in Bratislava, Bratislava, Slovakia

DOI: https://doi.org/10.1515/jee-2017-0025 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632

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Language: English

Page range: 167 - 179

Submitted on: Aug 3, 2016

Published on: Jul 6, 2017

Published by: Slovak University of Technology in Bratislava

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

Keywords:

VQ,

wireless channel,

logical channel,

wireless sensor network

Related subjects:

Introductions and overviews,

Engineering, other

© 2017 Tibor Csóka, Jaroslav Polec, Filip Csóka, Kvetoslava Kotuliaková, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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