Abstract
The publication describes how diffraction methods and mathematical bases can be used for measurement of various types of stresses in single-phase and multiphase materials. Firstly, the paper defines the stresses and classifies them from the scale of their interactions point of view. Subsequently, the phenomenon of radiation diffraction on the crystalline lattice is presented including formulas describing this phenomenon and the dependencies enabling stress measurements. The key part of the paper is the description of one of the second order stress estimation methods based on diffraction data and a self-consistent model.