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Automatic parametric fault detection in complex analog systems based on a method of minimum node selection Cover

Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

International Journal of Applied Mathematics and Computer Science
Volume 26 (2016): Issue 3 (September 2016)
By: Adrian Bilski and  Jacek Wojciechowski  
Open Access
|Sep 2016

Authors

Adrian Bilski

adrian_bilski@sggw.pl

Jacek Wojciechowski

DOI: https://doi.org/10.1515/amcs-2016-0045 | Journal eISSN: 2083-8492 | Journal ISSN: 1641-876X
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Language: English
Page range: 655 - 668
Submitted on: Oct 24, 2014
|
Accepted on: Mar 9, 2016
|
Published on: Sep 29, 2016
Published by: University of Zielona Góra
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
complex analog systems,
support vector machine,
tabu search,
genetic algorithm,
parametric fault detection
Related subjects:
Mathematics,
Applied mathematics

© 2016 Adrian Bilski, Jacek Wojciechowski, published by University of Zielona Góra
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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