Skip to main content
Have a personal or library account? Click to login
Ensemble Learning for Face Recognition in Suspect Identification using Cloud Environment Cover

Ensemble Learning for Face Recognition in Suspect Identification using Cloud Environment

Open Access
|Jun 2026

Figures & Tables

Figure 1.

Face Recognition Process

Figure 2.

Face Recognition Stages

Figure 3.

Facial Detection and Alignment

Figure 4.

Facial Detection by Different Detectors

Figure 5.

Nodal Points on Two Different People

Figure 6.

Measured and Declared Accuracy Comparision

Figure 7.

Time Taken local and cloud environment.

Figure 8.

Time Taken local and cloud environment.

Cosine metric accuracy

DetectorFaceNet5l2Face NetVGG-FaceArcFaceSFaceDeepFaceDeepID
retinaface98.496.495.896.692.467.764.4
mtcnn97.696.895.99690.566.363
fastmtcnn98.197.295.896.49067.463.6
dlib9792.694.595.169.866.558.7
yolov897.395.79595.591.967.565.9
yunet97.997.49696.79166.563.5
centerface97.796.895.796.589.367.863.6
mediapipe96.190.692.990.375.464.863
ssd88.787.58786.284.563.862.6
opencv87.684.987.284.683.663.760.1

Cosine Similarity distance

SampleFaceNet5l2FaceNetVGG-FaceArcFaceSFaceDeepFaceDeepIDEnsemble
200.190.120.460.350.290.110.120.12
500.170.20.420.310.220.20.270.2

Measure and Declared accuracy

DetectorFaceNet512FaceNetVGG-FaceArcFaceSFaceDeepFaceDeepIDEnsemble
Measured98.497.496.796.7936966.598.80
Declared99.699.298.999.599.597.397.4NA

Euclidean metric accuracy

DetectorFaceNet5l2FaceNetVGG-FaceArcFaceSFaceDeepFaceDeepID
Retinaface95.993.595.885.280.26765.6
MTCNN95.293.895.983.777.466.563.5
FastMTCNN9693.495.883.577.766.764
Dlib9690.894.588.666.363.460.4
Yolov894.491.99584.173.46966.5
Yunet97.396.19684.979.465.865.2
CenterFace97.695.895.783.677.465.562.8
MediaPipe95.188.692.973.272.561.862.2
SSD88.985.68775.876.963.462.5
OpenCV88.284.287.37381.165.559.6
DOI: https://doi.org/10.14313/jamris-2026-022 | Journal eISSN: 2080-2145 | Journal ISSN: 1897-8649
Language: English
Page range: 85 - 94
Submitted on: Aug 21, 2024
Accepted on: Sep 24, 2024
Published on: Jun 22, 2026
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2026 Shilpa Chaudhari, Rajarajeswari S, Archana Rane, published by Łukasiewicz Research Network – Industrial Research Institute for Automation and Measurements PIAP
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.