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Showing 1-2 of 2 for the term ""Sahni, Sanjeev P.""

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Validating a destructive measurement system using Gauge R&R — a case study

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Validating a destructive measurement system using Gauge R&R — a case study

Sharma, Mithun, Sahni, Sanjeev P., Sharma, Shilpi

Reduction of defects in the lapping process of the silicon wafer manufacturing: the Six Sigma application

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Article

Reduction of defects in the lapping process of the silicon wafer manufacturing: the Six Sigma application

Sharma, Mithun, Sahni, Sanjeev P., Sharma, Shilpi

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Showing 1-2 of 2 for the term ""Sahni, Sanjeev P.""

AI-powered search

Access type

All content2

Public access2

Licensed via my library

Publication type

Journal

Article2

Book

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Proceedings

Subject

Publisher

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Content type

Academic2

Professional

.blurhash-client-img { display: none !important; }

Article

Validating a destructive measurement system using Gauge R&R — a case study

Sharma, Mithun, Sahni, Sanjeev P., Sharma, Shilpi

.blurhash-client-img { display: none !important; }

Article

Reduction of defects in the lapping process of the silicon wafer manufacturing: the Six Sigma application

Sharma, Mithun, Sahni, Sanjeev P., Sharma, Shilpi

Page

of 1