Temperature dependent dispersion models applicable in solid state physics
Franta, Daniel, Vohánka, Jiří, Čermák, Martin, Franta, Pavel, Ohlídal, Ivan
Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films
Ohlídal, Ivan, Vohánka, Jiří, Franta, Daniel, Čermák, Martin, Ženíšek, Jaroslav, Vašina, Petr