Deriving the exchange times for a model of trap-assisted tunnelling
Racko, Juraj, Mikolášek, Miroslav, Kadlečíková, Magdaléna, Benko, Peter, Chvála, Aleš
Electrical Properties of Recessed Algan/Gan Schottky Diodes Under off–State Stress
Florovič, Martin, Kováč, Jaroslav, Benko, Peter, Chvála, Aleš, Škriniarová, Jaroslava, Kordó, Peter
Coupled Defect Level Recombination in the P—N Junction
Racko, Juraj, Mikolášek, Miroslav, Benko, Peter, Gallo, Ondrej, Harmatha, Ladislav, Granzner, Ralf, Schwierz, Frank