Multifractal characterization of epitaxial silicon carbide on silicon
Ştefan Ţălu, Sebastian Stach, Shikhgasan Ramazanov, Dinara Sobola, Guseyn Ramazanov
Stereometric analysis of Ta2O5 thin films
Dinara Sobola, Pavel Kaspar, Jindrich Oulehla, Ştefan Ţălu, Nikola Papež
Morphological features in aluminum nitride epilayers prepared by magnetron sputtering
Sebastian Stach, Dinara Dallaeva, Ştefan Ţălu, Pavel Kaspar, Pavel Tománek, Stefano Giovanzana, Lubomír Grmela
Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering
Ştefan Ţǎlu, Sebastian Stach, Shahoo Valedbagi, S. Mohammad Elahi, Reza Bavadi
Multifractal characteristics of titanium nitride thin films
Ştefan Ţălu, Sebastian Stach, Shahoo Valedbagi, Reza Bavadi, S. Mohammad Elahi, Mihai Ţălu
Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis
Ştefan Ţălu, Slawomir Kulesza, Miroslaw Bramowicz, Shahram Solaymani, Mihai Ţălu, Negin Beryani Nezafat, Sahar Rezaee