Automated Security Analysis for Industrial Control Systems based on MITRE ATT&CK and IEC 62443
Publisher:KIT Scientific Publishing
By: Jonas Vogl
Table of contents
Formal Process Maturity Measure
Securing XAI through Trusted Computing
Causal Representation Learning: A Quick Survey
Bayesian Optimization of Immature Multi-StageProcesses
Study design for human acuity in symbol recognition
Automated Security Analysis for Industrial Control Systems based on MITRE ATT&CK and IEC 62443
Incorporating Causal Prior Knowledge into Deep Neural Networks
An Evaluation of Large Language Models for Procedural Action Anticipation
8 chapters available
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Paperback ISBN: 978-3-7315-1351-3 | DOI: https://doi.org/10.58895/ksp/1000168973
Publisher: KIT Scientific Publishing
Publication date: 2026
Language: English
Pages: 142
Related subjects:
BISAC subjects:
COM000000
Thema subjects:
U