Thin-Film Transistor Reliability provides a comprehensive analysis of the reliability challenges in thin-film transistors (TFTs), essential components in modern electronics. Covering topics from fundamental structures to degradation mechanisms, this book equips researchers and engineers with the tools to assess, analyze, and improve TFT reliability.
The book systematically explores key reliability concerns, including performance characterization, defect states, voltage stress effects, circuit-level degradation, and environmental influences. Advanced reliability analysis methods and practical improvement strategies are also discussed, offering insights into future developments.
Key Features:
- In-depth discussion of TFT degradation mechanisms and reliability concerns.
- Comprehensive analysis techniques, including transfer curve and noise analysis.
- Effects of DC/AC voltage stress, self-heating, and environmental factors.
- Strategies for enhancing TFT reliability through structural modifications.
Readership:
Researchers, engineers, graduate students, and industry professionals in semiconductor electronics and display technology.
