Is Atomic Force Microscope a Suitable Tool for Studying Crossing Lines?
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DOI: https://doi.org/10.69525/jasqde.153 | Journal eISSN: 1524-7287
Language: English
Page range: 41 - 49
Published on: Dec 1, 2008
Published by: American Society of Questioned Document Examiners
In partnership with: Paradigm Publishing Services
© 2008 Magdalena Ezcurra, published by American Society of Questioned Document Examiners
This work is licensed under the Creative Commons Attribution 4.0 License.