Authors
Min Tian
School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China
Yingjing Shi
School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China
Rui Li
School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China
Esteban Tlelo-Cuautle
Department of Electronics, National Institute of Astophysics, Optics and Electronics (INAOE), Mexico, Mexico