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Detection of Potentially Anomalous Cosmic Particle Tracks Acquired with CMOS Sensors: Validation of Rough k–Means Clustering with PCA Feature Extraction Cover

Detection of Potentially Anomalous Cosmic Particle Tracks Acquired with CMOS Sensors: Validation of Rough k–Means Clustering with PCA Feature Extraction

International Journal of Applied Mathematics and Computer Science
Volume 35 (2025): Issue 1 (March 2025)
By: Tomasz Hachaj,  Marcin Piekarczyk and  Jarosław Wąs  
Open Access
|Apr 2025

Authors

Tomasz Hachaj

tomasz.hachaj@agh.edu.pl

Faculty of Electrical Engineering, Automatics, Computer Science and Biomedical Engineering, AGH University of Krakow, Krakow, Poland

Marcin Piekarczyk

Faculty of Electrical Engineering, Automatics, Computer Science and Biomedical Engineering, AGH University of Krakow, Krakow, Poland

Jarosław Wąs

Faculty of Electrical Engineering, Automatics, Computer Science and Biomedical Engineering, AGH University of Krakow, Krakow, Poland
DOI: https://doi.org/10.61822/amcs-2025-0001 | Journal eISSN: 2083-8492 | Journal ISSN: 1641-876X
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Language: English
Page range: 7 - 18
Submitted on: Mar 9, 2024
Accepted on: Jan 9, 2025
Published on: Apr 1, 2025
Published by: University of Zielona Góra
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
cosmic-ray particle,
rough sets,
rough k-means,
anomalies detection,
principal components analysis,
complementary metal-oxide-semiconductor sensors
Related subjects:
Mathematics,
Applied mathematics

© 2025 Tomasz Hachaj, Marcin Piekarczyk, Jarosław Wąs, published by University of Zielona Góra
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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