
Electric field penetration effects in time-of-flight measurements
By: UK Abeywarna and TR Ariyaratne
Open Access
|Dec 2003Authors
DOI: https://doi.org/10.4038/sljp.v4i0.191 | Journal eISSN: 2478-1193
Language: English
Page range: 35 - 45
Published on: Dec 5, 2003
Published by: Institute of Physics, Sri Lanka
In partnership with: Paradigm Publishing Services
© 2003 UK Abeywarna, TR Ariyaratne, published by Institute of Physics, Sri Lanka
This work is licensed under the Creative Commons License.