Observation of defect interface states at the Cu2O/CuxS junction using thermally stimulated I-V measurements
By: SRD Kalingamudali and W Siripala
Open Access
|Dec 2001DOI: https://doi.org/10.4038/sljp.v2i0.175 | Journal eISSN: 2478-1193
Language: English
Page range: 7 - 12
Published on: Dec 17, 2001
Published by: Institute of Physics, Sri Lanka
In partnership with: Paradigm Publishing Services
© 2001 SRD Kalingamudali, W Siripala, published by Institute of Physics, Sri Lanka
This work is licensed under the Creative Commons License.