
XRD and optical studies of CdI2 thin films with varying grain size and thickness for the control of bandgaps
By: M. Idrish Miah
Abstract
Cadmium iodide (CdI2) thin films with varying grain size and thickness were studied for exploring the strategy of controlling bandgap (Eg) in the thin film-materials. The grain size (D) was calculated from the X-ray diffraction (XRD) and was found to increase with increasing the thickness (L) of the film. A variation of the refractive index (n) with the variation of L was observed, which might be due to the variation of both density and electronic structure. However, n was found to decrease with increasing the wavelength of light. The optical absorption spectra showed both allowed direct and indirect interband transitions across a fundamental gap. It was found that both indirect and direct Eg decrease with increasing L and that the indirect Eg was lower than the direct Eg, confirming the results of the earlier band structure calculations. The direct Eg was also found to decrease with increasing D. The results demonstrate the possibility of controlling and manipulating Eg by adjusting D and L.
DOI: https://doi.org/10.4038/sljp.v26i1.8170 | Journal eISSN: 2478-1193
Language: English
Page range: 1 - 10
Published on: Jun 9, 2026
Published by: Institute of Physics, Sri Lanka
In partnership with: Paradigm Publishing Services
Keywords:
© 2026 M. Idrish Miah, published by Institute of Physics, Sri Lanka
This work is licensed under the Creative Commons Attribution 4.0 License.