
A Goodness of Fit Test for a Survival and Count Bayesian Joint Model: In the Presence of Clusters
Authors
DOI: https://doi.org/10.4038/sljastats.v24i1.8090 | Journal eISSN: 2424-6271
Language: English
Page range: 1 - 18
Published on: Jul 5, 2023
Published by: The Institute of Applied Statistics, Sri Lanka
In partnership with: Paradigm Publishing Services
Keywords:
© 2023 K. U. S. Kumaranathunga, M. R. Sooriyarachchi, published by The Institute of Applied Statistics, Sri Lanka
This work is licensed under the Creative Commons Attribution 4.0 License.