Electrodeposition and characterization of as-deposited and annealed CdTe thin films

Thin films of CdTe semiconductor materials were grown on fluorine doped tin oxide (FTO) conducting glass substrates using the technique of electrodeposition. CdSO₄ at high concentrations and CdCl₂, TeO₂ at low concentrations were used as precursor salts for electrodeposition. The range of deposition potentials was estimated using cyclic voltammetric measurements. The electrical, optical, structural and morphological characteristics of as-deposited and annealed CdTe thin films were characterized using photo-electrochemical (PEC) cell studies, UV-Vis spectrophotometry, X-ray diffraction (XRD) and scanning electron microscopy (SEM). These particular samples were converted from n-type into p-type after heat treatment. UV-Vis spectrometric measurements for CdTe layers indicated that, the energy band gaps of 1.45±0.02 eV for both as-deposited and annealed samples which exhibited the required optical property for fabricating CdS/CdTe solar cells. Little increase in (220) and (311) peaks of XRD spectra were observed for annealed layers compared to the as-deposited material. However, annealing exhibited a small reduction of cubic phase preferential orientation (111). The optical transmission for both as-deposited and annealed CdTe samples were about 60% for wavelengths longer than about 850 nm.