Development of the web-based NIST X-ray Photoelectron Spectroscopy (XPS) Database Cover

Development of the web-based NIST X-ray Photoelectron Spectroscopy (XPS) Database

Data Science Journal

Volume 1 (2006): Issue 1

By: Angela Y Lee, Dorothy M Blakeslee, Cedric J Powell and Jr John R Rumble

Open Access

|Jan 2006

Authors

Angela Y Lee

Standard Reference Data Program, National Institute of Standards and Technology, Gaithersburg, MD 20899-2310

Dorothy M Blakeslee

info@ubiquitypress.com

Standard Reference Data Program, National Institute of Standards and Technology, Gaithersburg, MD 20899-2310

Cedric J Powell

info@ubiquitypress.com

Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8370

Jr John R Rumble

info@ubiquitypress.com

Standard Reference Data Program, National Institute of Standards and Technology, Gaithersburg, MD 20899-2310

DOI: https://doi.org/10.2481/dsj.1.1 | Journal eISSN: 1683-1470

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Language: English

Published on: Jan 1, 2006

Published by: Ubiquity Press

In partnership with: Paradigm Publishing Services

Publication frequency: 1 issue per year

Keywords:

Surface Analysis,

X-ray Photoelectron Spectroscopy,

Auger-Electron Kinetic Energies,

Auger Parameters,

Chemical Shifts,

Core-Electron Binding Energies,

© 2006 Angela Y Lee, Dorothy M Blakeslee, Cedric J Powell, Jr John R Rumble, published by Ubiquity Press
This work is licensed under the Creative Commons Attribution 4.0 License.

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