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Reliability Properties of Residual Life Time and Inactivity Time of Series and Parallel System Cover

Reliability Properties of Residual Life Time and Inactivity Time of Series and Parallel System

Journal of Applied Mathematics, Statistics and Informatics
Volume 8 (2012): Issue 1 (May 2012)
By: Nitin Gupta,  Neeraj Gandotra and  Rakesh Bajaj  
Open Access
|Aug 2012

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DOI: https://doi.org/10.2478/v10294-012-0001-7 | Journal eISSN: 1339-0015 | Journal ISSN: 1336-9180
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Language: English
Page range: 5 - 16
Published on: Aug 13, 2012
Published by: University of Ss. Cyril and Methodius in Trnava
In partnership with: Paradigm Publishing Services
Publication frequency: 2 issues per year
Keywords:
Likelihood ratio order,
series system,
parallel system
Related subjects:
Computer sciences,
Information technology,
Mathematics,
Logic and set theory,
Probability and statistics,
Applied mathematics

© 2012 Nitin Gupta, Neeraj Gandotra, Rakesh Bajaj, published by University of Ss. Cyril and Methodius in Trnava
This work is licensed under the Creative Commons License.

Volume 8 (2012): Issue 1 (May 2012)