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Probability Density Functions of Voltage Sags Measured Indices Cover

Probability Density Functions of Voltage Sags Measured Indices

Open Access
|Dec 2011

Abstract

Voltage sags can cause interruptions of industrial processes, which could result as a malfunction of equipment and considerable economic losses. Thus, it is very useful to see certain rules of voltage sags occurrence due to duration and depth.

This paper presents statistical analyses of voltage sags in several domestic and industrial transformer stations. Voltage sag probability functions are calculated from actual measurement data, by means of a hill climbing algorithm. Lognormal and Weibull frequency distribution functions are used to describe distribution of measured voltage dips.

DOI: https://doi.org/10.2478/v10187-011-0053-8 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 335 - 341
Published on: Dec 21, 2011
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2011 Zvonimir Klaić, Damir Šljivac, Zoran Baus, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 62 (2011): Issue 6 (November 2011)