Enhancement of XPS surface sensitivity in nanocrystalline material
By: Rafal Wróbel
Open Access
|Dec 2010Abstract
The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.
DOI: https://doi.org/10.2478/v10026-010-0052-8 | Journal eISSN: 3072-0389
Language: English
Page range: 62 - 63
Published on: Dec 28, 2010
Published by: West Pomeranian University of Technology, Szczecin
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2010 Rafal Wróbel, published by West Pomeranian University of Technology, Szczecin
This work is licensed under the Creative Commons License.