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Role of substrate temperature on the growth mechanism and physical properties of spray deposited lead oxide thin films Cover

Role of substrate temperature on the growth mechanism and physical properties of spray deposited lead oxide thin films

Materials Science-Poland
Volume 32 (2014): Issue 3 (September 2014)
By: ,   and    
Open Access
|Oct 2014
References

References

  1. [1] Kotz R., Stucky S., Carcer B., J. Appl. Electrochem., 21 (1991), 14. http://dx.doi.org/10.1007/BF01103823
    Open DOISearch in Google Scholar
  2. [2] Lipp L., Pletcher D., Electrochim. Acta, 42 (1997), 1091. http://dx.doi.org/10.1016/S0013-4686(96)00257-5
    Open DOISearch in Google Scholar
  3. [3] Comninellis C., Pulgarin C., J. Appl. Electrochem., 23 (1993), 108. http://dx.doi.org/10.1007/BF00246946
    Open DOISearch in Google Scholar
  4. [4] Veluchamy P., Sharon M., Shimizu M., Minoura H., J. Electroanal. Chem., 365 (1994), 179. http://dx.doi.org/10.1016/0022-0728(93)02973-L
    Open DOISearch in Google Scholar
  5. [5] Ghasemi S., Mousavi M.F., Shamsipur M., Karami H., Ultrason. Sonochem., 15 (2008), 448. http://dx.doi.org/10.1016/j.ultsonch.2007.05.006
    Open DOISearch in Google Scholar
  6. [6] Zhang L., Guo F., Liu X., Cui J., Qian Y.T., J. Cryst. Growth., 280 (2005), 575. http://dx.doi.org/10.1016/j.jcrysgro.2005.03.073
    Open DOISearch in Google Scholar
  7. [7] Chao S., Fuang Y.F., Chen Y.C., Yan L., J. Phys. D Appl. Phys., 23 (1990), 955. http://dx.doi.org/10.1088/0022-3727/23/7/032
    Open DOISearch in Google Scholar
  8. [8] Madsen L.D., Weaver L., J. Am. Ceram. Soc., 81 (1998), 988. http://dx.doi.org/10.1111/j.1151-2916.1998.tb02436.x
    Open DOISearch in Google Scholar
  9. [9] Bersani M., Morten B., Prudenziati M., J. Mater. Res., 12 (1997), 501. http://dx.doi.org/10.1557/JMR.1997.0072
    Open DOISearch in Google Scholar
  10. [10] Trinquier G., Hoffmann R., J. Phys. Chem., 88 (1984), 6696. http://dx.doi.org/10.1021/j150670a038
    Open DOISearch in Google Scholar
  11. [11] Samoilenkov S.V., Adamov G.E., Gorbenko O.Y., Graboy I.E., Kaul A.R., Zandbergen H.W., Physica C, 338 (2000), 189. http://dx.doi.org/10.1016/S0921-4534(00)00301-4
    Open DOISearch in Google Scholar
  12. [12] Neumayer D.A., Schulz D.L., Richeson D.S., Marks T.J., Degrout D.C., Schindler J.L., Kannewurf C.R., Thin Solid Films, 216 (1992), 41. http://dx.doi.org/10.1016/0040-6090(92)90866-A
    Open DOISearch in Google Scholar
  13. [13] Thangaraju B., Kaliannan P., Semicond. Sci. Tech., 15 (2000), 542. http://dx.doi.org/10.1088/0268-1242/15/6/309
    Open DOISearch in Google Scholar
  14. [14] Martos M., Morales J., Sanchez L., Ayouchi R., Leinen D., Martin F., RAMOS Barrado J.R., Electrochim. Acta, 46 (2001), 2939. http://dx.doi.org/10.1016/S0013-4686(01)00512-6
    Open DOISearch in Google Scholar
  15. [15] Greenwood N.N., Earnshaw A., Chemistry of the Elements, 2nd ed., Butterworth Heinemann, Oxford, 2001.
    Search in Google Scholar
  16. [16] Kim J.H., Kim Y., Chien A.T., Lange F.F., J. Mater. Res., 16 (2001), 1739. http://dx.doi.org/10.1557/JMR.2001.0240
    Open DOISearch in Google Scholar
  17. [17] Baleva M., Tuncheva V., J. Mater. Sci. Lett., 13 (1994), 3. http://dx.doi.org/10.1007/BF02352902
    Open DOISearch in Google Scholar
  18. [18] Venkataraj S., Geurts J., Weis H., Jayavel R., Wuttig M., J. Vac. Sci. Technol. A, 19 (2001), 2870. http://dx.doi.org/10.1116/1.1410948
    Open DOISearch in Google Scholar
  19. [19] Zhitomirsky I., Gal-Or L., Kohn A., Hennicke H.W., J. Mater. Sci. Lett., 14 (1995), 807. http://dx.doi.org/10.1007/BF00278136
    Open DOISearch in Google Scholar
  20. [20] Patil P.S., Mater. Chem. Phys., 59 (1999), 185. http://dx.doi.org/10.1016/S0254-0584(99)00049-8
    Open DOISearch in Google Scholar
  21. [21] Ayouchi A., Martin M., Leinen D., Ramosbarrado J.R., J. Cryst. Growth, 247 (2003), 497. http://dx.doi.org/10.1016/S0022-0248(02)01917-6
    Open DOISearch in Google Scholar
  22. [22] Kamal H., Elmaghraby E.K., Aly S.A., Abdelhady K., J. Cryst. Growth, 262(14) (2004), 424. http://dx.doi.org/10.1016/j.jcrysgro.2003.10.090
    Open DOISearch in Google Scholar
  23. [23] Chitra Agashe, Takwale M.G., Marathe B.R., Bhide V.G., Sol. Energ. Mat. Sol. C., 17 (1988), 99. http://dx.doi.org/10.1016/0165-1633(88)90010-X
    Open DOISearch in Google Scholar
  24. [24] Deokate R.J., Pawar S.M., Moholkar A.V., Sawant V.S., Pawar C.A., Bhosale C.H., Rajpure K.Y., Appl. Surf. Sci., 254 (2008), 2187. http://dx.doi.org/10.1016/j.apsusc.2007.09.006
    Open DOISearch in Google Scholar
  25. [25] Cruz M., Hernan L., Morales J., Sanchez L., J. Power Sources, 108 (2002), 35. http://dx.doi.org/10.1016/S0378-7753(02)00006-X
    Open DOISearch in Google Scholar
  26. [26] Ma Ying-ren, J. Appl. Phys., 76 (1994), 2860. http://dx.doi.org/10.1063/1.357522
    Open DOISearch in Google Scholar
  27. [27] Mahmoud S.A., Alshomer S., Tarawnh M.A., J. Mod. Phys., 2 (2011), 1178. http://dx.doi.org/10.4236/jmp.2011.210147
    Open DOISearch in Google Scholar
  28. [28] Radhakrishnan S., Kamalasanam M.N., Mahendru P.C., J. Mater. Sci., 18 (1983), 1912. http://dx.doi.org/10.1007/BF00554982
    Open DOISearch in Google Scholar
  29. [29] Arai T., J. Phys. Soc. Jpn., 15 (1960), 916. http://dx.doi.org/10.1143/JPSJ.15.916
    Open DOISearch in Google Scholar
  30. [30] Venkatara S., Geurts J., Weis H., Kappertz O., Njoroge W.K., Jayavel R., J. Vac. Sci. Technol. A, 19 (2001), 2870. http://dx.doi.org/10.1116/1.1410948
    Open DOISearch in Google Scholar
  31. [31] Ohhyeon Hwang, Sangsu Kim, Jong Heesuh, Shinttang Cho, Kittyun Kim, Jinki Hong, Sunung Kim, Nucl. Instrum. Meth. A, 633 (2011), 569.
    Search in Google Scholar
  32. [32] Salunkhe R.R., Dhawale D.S., Gujar T.P., Lokhande C.D., Mater. Res. Bull., 44 (2009), 364. http://dx.doi.org/10.1016/j.materresbull.2008.05.010
    Open DOISearch in Google Scholar
  33. [33] Ratheesh Kumar P.M., Sudhakartha C., Vijayakumar K.P., Singh F., Avasthi D.K., Abi T., Kashiwabe Y., Okram G.S., Kumar M., Sarveesh Kumar., J. Appl. Phys., 97 (2005), 013509. http://dx.doi.org/10.1063/1.1823574
    Open DOISearch in Google Scholar
  34. [34] Singh R., Arora S.K., Singh J.P., Renu Tyagi, Agarwal S.K., Kanjilal D., Mater. Sci. Eng. BAdv., 86 (2001), 228. http://dx.doi.org/10.1016/S0921-5107(01)00707-3
    Open DOISearch in Google Scholar
  35. [35] Khadeer Pasha S.K., Chidambaram K., Vijayan N., Madhuri W., Optoelectron. Adv. Mat., 6(1–2) (2012), 110.
    Search in Google Scholar
DOI: https://doi.org/10.2478/s13536-014-0208-y | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
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Language: English
Page range: 448 - 456
Published on: Oct 17, 2014
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
thin films,
X-ray diffraction,
crystal structure,
energy band gap,
electrical properties
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2014 M. Suganya, A. Balu, K. Usharani, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 32 (2014): Issue 3 (September 2014)
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