Skip to main content
Have a personal or library account? Click to login
Structural and surface properties of TiO2 thin films doped with neodymium deposited by reactive magnetron sputtering Cover

Structural and surface properties of TiO2 thin films doped with neodymium deposited by reactive magnetron sputtering

Materials Science-Poland
Volume 31 (2013): Issue 1 (January 2013)
By: ,  ,  ,  ,   and    
Open Access
|Feb 2013
References

References

  1. [1] Podhorodecki A., Zatryb G., Misiewicz J., Domaradzki J., Kaczmarek D., Borkowska A., J. Electrochem. Soc., 156 (2009), H214. http://dx.doi.org/10.1149/1.3056039
    Open DOISearch in Google Scholar
  2. [2] Podhorodecki A., Zatryb G., Sitarek P., Misiewicz J., Domaradzki J., Kaczmarek D., Borkowska A., Thin Solid Films, 517 (2009), 6331. http://dx.doi.org/10.1016/j.tsf.2009.02.080
    Open DOISearch in Google Scholar
  3. [3] Domaradzki J., Borkowska A., Kaczmarek D., Podhorodecki A., Misiewicz J., Opt. Appl., 37 (2007), 51.
    Search in Google Scholar
  4. [4] Domardzki J., Kaczmarek D., Borkowska A., Schmeisser D., Mueller S., Wasielewski R., Ciszewski A., Wojcieszak D., Vacuum, 82 (2008), 1007. http://dx.doi.org/10.1016/j.vacuum.2008.01.021
    Open DOISearch in Google Scholar
  5. [5] Domaradzki J., Kaczmarek D., Prociow E., Wojcieszak D., Sieradzka K., Mazur M., Łapinski M., Opt. Appl., 39(4) 2009, 815.
    Search in Google Scholar
  6. [6] Li C., Zhan Y., Liu J., Du Y., Gao Q., Li X., J. Alloy. Compd., 477 (2009), 274. http://dx.doi.org/10.1016/j.jallcom.2008.10.129
    Open DOISearch in Google Scholar
  7. [7] Liu Y., Chen L.F., Wei W.F., Tang H.P., Liu B., Huang B.Y., J. Mater. Sci. Technol., 22(4), (2006), 465.
    Search in Google Scholar
  8. [8] Xia K., Li W., Liu C., Scripta Mater., 41(1) (1999), 67. http://dx.doi.org/10.1016/S1359-6462(99)00055-X
    Open DOISearch in Google Scholar
  9. [9] Shao Z., Saitzek S., Roussel P., Mentre O., Prihor Gheorghiu F., Mitoseriu L., Desfeux R., J. Solid State Chem., 183 (2010), 1652. http://dx.doi.org/10.1016/j.jssc.2010.05.004
    Open DOISearch in Google Scholar
  10. [10] Uno M., Kosuga A., Okui M., Horisaka K., Yamanaka S., J. Alloys Compd., 400 (2005), 270. http://dx.doi.org/10.1016/j.jallcom.2005.04.004
    Open DOISearch in Google Scholar
  11. [11] Song H., Peng T., Cai P., Yi H., Yan C., Catal. Lett., 113(1–2) (2007), 54. http://dx.doi.org/10.1007/s10562-006-9004-6
    Open DOISearch in Google Scholar
  12. [12] Otsuka-Yao-Matsuo S., Omata T., Yoshimura M., J. Alloys Compd., 376 (2004), 262. http://dx.doi.org/10.1016/j.jallcom.2004.01.006
    Open DOISearch in Google Scholar
  13. [13] Diallo P.T., Boutinaud P., Mahiou R.,J. Alloys Compd., 341 (2002), 139. http://dx.doi.org/10.1016/S0925-8388(02)00098-1
    Open DOISearch in Google Scholar
  14. [14] Joseph L.K., Dayas K.R., Damodar S., Krishnan B., Krishnankutty K., Nampoori V.P.N., Radhakrishnan P., Spectrochim. Acta Part A, 71 (2008), 1281. http://dx.doi.org/10.1016/j.saa.2008.03.030
    Open DOISearch in Google Scholar
  15. [15] Kim W.S., Ha S.M., Yun S., Park H.H., Thin Solid Films, 420 (2002), 575. http://dx.doi.org/10.1016/S0040-6090(02)00837-4
    Open DOISearch in Google Scholar
  16. [16] Kim W.S., Ha S.M., Yang J.K., Park H.H., Thin Solid Films, 398 (2001), 663. http://dx.doi.org/10.1016/S0040-6090(01)01333-5
    Open DOISearch in Google Scholar
  17. [17] Sayir A., Farmer S.C., Dynys F., Ceram. Trans., 179 (2006), 57.
    Search in Google Scholar
  18. [18] Shao Z., Saitzek S., Roussel P., Huve M., Desfeux R., Mentre O., Abraham F., J. Cryst. Growth, 311 (2009), 4134. http://dx.doi.org/10.1016/j.jcrysgro.2009.06.051
    Open DOISearch in Google Scholar
  19. [19] Todorovsky D.S., Todorovska R.V., Milanova M.M., Kovacheva D.G., Appl. Surf. Sci., 253 (2007), 4560. http://dx.doi.org/10.1016/j.apsusc.2006.10.016
    Open DOISearch in Google Scholar
  20. [20] Song Y.J., Ferroelectric Thin Films for High Density Non-volatile Memories, Virgina Polytechnic Institute and State University, Blacksburg, 1998 (Ph. D. Thesis).
    Search in Google Scholar
  21. [21] Havelia S., Balasubramaniam K.R., Spurgeon S., Cormack F., Salvador P.A., J. Cryst. Growth, 310 (2008), 1985. http://dx.doi.org/10.1016/j.jcrysgro.2007.12.006
    Open DOISearch in Google Scholar
  22. [22] Ohtomo A., Muller D.A., Grazul J.L., Hwang H.Y., Appl. Phys. Lett., 80(21) (2002), 3922. http://dx.doi.org/10.1063/1.1481767
    Open DOISearch in Google Scholar
  23. [23] Li Z., Xue H., Wang X., Fu X., J. Mol. Cat. A-Chem., 260 (2006), 56. http://dx.doi.org/10.1016/j.molcata.2006.06.056
    Open DOISearch in Google Scholar
  24. [24] Sandstrom M.M., Fuierer P., J. Mater. Res., 18(2) (2003), 357. http://dx.doi.org/10.1557/JMR.2003.0046
    Open DOISearch in Google Scholar
  25. [25] Prasadarao A.V., Selvaraj U., Kamrneni S., Bhalla A.S., J. Mater. Res., 7(10) (1992), 2859. http://dx.doi.org/10.1557/JMR.1992.2859
    Open DOISearch in Google Scholar
  26. [26] Prociow E.L., Domaradzki J., Kaczmarek D., Berlicki T., Polish patent application P382163 (2007).
    Search in Google Scholar
  27. [27] Wasielewski R., Domaradzki J., Wojcieszak D., Kaczmarek D., Borkowska A., Prociow E.L., Ciszewski A., Appl. Surf. Sci., 254 (2008), 4396. http://dx.doi.org/10.1016/j.apsusc.2008.01.017
    Open DOISearch in Google Scholar
  28. [28] Horcas I., Fernandez R., Gomez-Rodriguez J.M., Colchero J., Gomez-Herrero J., Fernandez B., Baro A.M., Rev. Sci. Instrum., 78, 013705 (2007). http://dx.doi.org/10.1063/1.2432410
    Open DOISearch in Google Scholar
  29. [29] Ogwu A.A., Bouguerel E., Ademosu O., Moh S., Crossan E., Placido F., Acta Mater., 53 (2005), 5151. http://dx.doi.org/10.1016/j.actamat.2005.07.035
    Open DOISearch in Google Scholar
  30. [30] Sharfrin E., Zisman W.A., J. Phys. Chem., 64(5) (1960), 519. http://dx.doi.org/10.1021/j100834a002
    Open DOISearch in Google Scholar
  31. [31] Kwok D.Y., Neumann A.W., Adv. Colloid Interfac., 81 (1999), 167. http://dx.doi.org/10.1016/S0001-8686(98)00087-6
    Open DOISearch in Google Scholar
  32. [32] Klug H.P., Alexander L.E., X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, John Wiley and Sons, New York, 1974, p. 635.
    Search in Google Scholar
  33. [33] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Philadelphia, PA: ASTM; 1967 Card 21-1272.
    Search in Google Scholar
  34. [34] Powder Diffraction File. Joint Committee on Powder Diffraction Standards. Philadelphia, PA: ASTM; 1967 Card 21-1276.
    Search in Google Scholar
  35. [35] Moulder J.F., Stickle W.F., Sobol P.E., Bomben K.D., Handbook of X-ray spectrophotometry, Physical Electronisc Inc., 1995.
    Search in Google Scholar
  36. [36] Pouilleau J., Devilliers D., Garrido F., Durand-Vidal S., Mahe E., Mater. Sci. Eng., B47 (1998), 235.
    Open DOISearch in Google Scholar
  37. [37] Zhao X.T., Sakka K., Kihara N., Takata Y., Arita M., Masuda M., Curr. Appl. Phys., 6 (2006), 931. http://dx.doi.org/10.1016/j.cap.2005.01.042
    Open DOISearch in Google Scholar
  38. [38] Fowkes F.M., J. Adhesion, 4 (1972), 155. http://dx.doi.org/10.1080/00218467208072219
    Open DOISearch in Google Scholar
DOI: https://doi.org/10.2478/s13536-012-0066-4 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Journal RSS Feed
Language: English
Page range: 71 - 79
Published on: Feb 9, 2013
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
TiO2 ,
neodymium,
physicochemical properties,
magnetron sputtering
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2013 Michał Mazur, Danuta Kaczmarek, Jarosław Domaradzki, Damian Wojcieszak, Piotr Mazur, Eugeniusz Prociow, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 31 (2013): Issue 1 (January 2013)
Previous article
Next article