Skip to main content
Have a personal or library account? Click to login
Mechanisms of carriers transport in Ni/n-SiC, Ti/n-SiC ohmic contacts Cover

Mechanisms of carriers transport in Ni/n-SiC, Ti/n-SiC ohmic contacts

Materials Science-Poland
Volume 29 (2011): Issue 3 (September 2011)
By: ,  ,  ,   and    
Open Access
|Feb 2012
References

References

  1. [1] Porter L.M., Davis R.F., Mater. Sci. Eng., B34 (1995), 83. http://dx.doi.org/10.1016/0921-5107(95)01276-1
    Open DOISearch in Google Scholar
  2. [2] Chang S-C., Wang S-J., Uang K-M., Liou B-W., Solid State Electronics, 49 (2005), 1937. http://dx.doi.org/10.1016/j.sse.2005.08.013
    Open DOISearch in Google Scholar
  3. [3] Blank T.V, Gol’dberd Yu.a., Semiconductors, 41 (2007), 1263. http://dx.doi.org/10.1134/S1063782607110012
    Open DOISearch in Google Scholar
  4. [4] Padovani F.A., Stratton R., Solid State Electron., 9 (1966), 695. http://dx.doi.org/10.1016/0038-1101(66)90097-9
    Open DOISearch in Google Scholar
  5. [5] Rhoderick E. H., Metal-Semiconductor Contacts, Clarendon, Oxford, 1978.
    Search in Google Scholar
  6. [6] Pecz B., To’th L., Di Forte-Poisson M., Vacas J., Appl. Surf. Sci, 206 (2003), 8. http://dx.doi.org/10.1016/S0169-4332(02)01195-9
    Open DOISearch in Google Scholar
  7. [7] Wang Z., Tsukimoto S., Mitsuhiro S., Kazuhiro I., Murakami M., Ikuhara Y., Phys. Rev., B 80 (2009), 245303. http://dx.doi.org/10.1103/PhysRevB.80.245303
    Open DOISearch in Google Scholar
  8. [8] Nikitina I.P., Vassilevski K.V., Wright N.G., Horsfall A.B., O’Neill A.G., Johnson C.M., J. Appl. Phys, 97 (2005), 083709. http://dx.doi.org/10.1063/1.1872200
    Open DOISearch in Google Scholar
  9. [9] Yuryeva E.I., Ivanovskii A.L., Russ. J. Coord. Chem., 28 (2002), 881. http://dx.doi.org/10.1023/A:1021646731718
    Open DOISearch in Google Scholar
  10. [10] Kurimoto E., Harima H., Toda T., Sawada M., Iwami M., Nakashima S., J. Appl. Phys., 91 (2002), 10215. http://dx.doi.org/10.1063/1.1473226
    Open DOISearch in Google Scholar
  11. [11] La Via F., Roccaforte F., Makhtari A., Raineri V., Musumeci P., Calcagno L., Microelectronic Eng., 60 (2002), 269. http://dx.doi.org/10.1016/S0167-9317(01)00604-9
    Open DOISearch in Google Scholar
  12. [12] Levit M., Grimberg I., Weiss B.-Z., J. Appl. Phys., 80 (1996), 167. http://dx.doi.org/10.1063/1.362801
    Open DOISearch in Google Scholar
  13. [13] Weijie L., Mitchel W.C., Landis G.R., Crenshaw T.R., Collins W.E., J. Appl. Phys., 93 (2003), 5397. http://dx.doi.org/10.1063/1.1562737
    Open DOISearch in Google Scholar
  14. [14] Seyller Th., Emtsev K.V., Speck F., Gao K.-Y., Ley L., Appl. Phys. Lett., 88 (2006), 242103. http://dx.doi.org/10.1063/1.2213928
    Open DOISearch in Google Scholar
  15. [15] Han S.Y., Kim K.H., Kim J.K., Jang H.W., Lee K.H., Kim N.-K. Kim E.-D., Lee J.-L., Appl. Phys. Lett., 79 (2001), 1816. http://dx.doi.org/10.1063/1.1404998
    Open DOISearch in Google Scholar
  16. [16] Weijie L., Mitchel W.C., Thornton C.A., Landis G.R., Collins W.E., J. Electronic Mat., 32 (2003), 426. http://dx.doi.org/10.1007/s11664-003-0172-5
    Open DOISearch in Google Scholar
  17. [17] Tung R.T., Mat. Sci. Eng., R35 (2001), 1.
    Search in Google Scholar
  18. [18] Wittmer M., Ting C.-Y., Ohdomari I., Tu K.N., J. Appl. Phys., 53 (1982), 6781. http://dx.doi.org/10.1063/1.330066
    Open DOISearch in Google Scholar
  19. [19] Bindell J.B., Moller W.M., Labuda E.F., IEEE Trans. Electron Devices, ED-27 (1980), 420. http://dx.doi.org/10.1109/T-ED.1980.19878
    Open DOISearch in Google Scholar
DOI: https://doi.org/10.2478/s13536-011-0036-2 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Journal RSS Feed
Language: English
Page range: 233 - 240
Published on: Feb 29, 2012
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
SiC,
ohmic contact,
carrier transport,
silicide,
carbide
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2012 R. Kisiel, M. Guziewicz, K. Golaszewska, M. Sochacki, W. Paszkowicz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 29 (2011): Issue 3 (September 2011)
Previous article