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Microwave dielectric properties of BiFeO3 multiferoic films deposited on conductive layers Cover

Microwave dielectric properties of BiFeO3 multiferoic films deposited on conductive layers

Materials Science-Poland
Volume 29 (2011): Issue 1 (March 2011)
By: ,  ,  ,  ,  ,   and    
Open Access
|Aug 2011
References

References

  1. [1] Fiebig M., J. Phys. D, 38 (2005). R123. http://dx.doi.org/10.1088/0022-3727/38/8/R01
    Open DOISearch in Google Scholar
  2. [2] Smolenskii G.A., Chupis I.E., Sov. Phys. Usp., 25 (1982), 475. http://dx.doi.org/10.1070/PU1982v025n07ABEH004570
    Open DOISearch in Google Scholar
  3. [3] Wang J., Neaton J.B., Zheng H., Nagarajan V., Ogale S.B., Liu B., Vehland D., Vaithyanathan V., Schlom D.G., Waghmare U.V., Spaldin N.A., Rabe K.M., Wuttig M., Ramesh R., Science, 299 (2003), 1719. http://dx.doi.org/10.1126/science.1080615
    Open DOISearch in Google Scholar
  4. [4] Yuan G. L., Ora S. W., Liu J. M., Liu Z.G., Appl. Phys. Lett., 89 (2006), 052905. http://dx.doi.org/10.1063/1.2266992
    Open DOISearch in Google Scholar
  5. [5] Yu B., Li M., Liu J., Guo D., Pei L., Zhao X., J. Appl. Phys., 41 (2008), 06503.
    Open DOISearch in Google Scholar
  6. [6] Takahashi K., Kida N., Tonouchi M., Phys. Rev. Lett., 96 (2006), 117402. http://dx.doi.org/10.1103/PhysRevLett.96.117402
    Open DOISearch in Google Scholar
  7. [7] Chen J.-C., Wu J.-M., Appl. Phys. Lett., 91 (2007), 182903. http://dx.doi.org/10.1063/1.2798256
    Open DOISearch in Google Scholar
  8. [8] Zhang X-Y., Song Q., Xu F., Ong C.K., Appl. Phys. Lett., 94 (2009), 022907. http://dx.doi.org/10.1063/1.3062857
    Open DOISearch in Google Scholar
  9. [9] Kamba S., Nuzhnyy D., Savinov M., Šebek J., Petzelt J., Prokleška J., Haumont R., Phys. Rev. B., 75 (2007), 024403. http://dx.doi.org/10.1103/PhysRevB.75.024403
    Open DOISearch in Google Scholar
  10. [10] Qi X., Dho J., Tomov R., Blamire M.G., Macmanus- Driscol J.L., Appl. Phys.Lett., 86 (2005), 062903. http://dx.doi.org/10.1063/1.1862336
    Open DOISearch in Google Scholar
  11. [11] Ma Z., Becker A.J., Polakos P., Huggins H., Pastalan J., Wu H., Watts K., Wong Y.H., Mankiewich P., IEEE Trans. Electron Devices, 45 (1998), 1811. http://dx.doi.org/10.1109/16.661229
    Open DOISearch in Google Scholar
  12. [12] Sobiestianskas R., Vengalis B., Banys J., Proc. IEEE 18th Intl. Symp. Applications of Ferroelectrics ISAF 2009, Xian, China, 2009, p.232.
    Search in Google Scholar
  13. [13] Lancaster M.J., Powell J., Porch A., Supercond. Sci. Technol., 11 (1998), 1323. http://dx.doi.org/10.1088/0953-2048/11/11/021
    Open DOISearch in Google Scholar
  14. [14] Krainik N.N., Khuchua N.P., Zhdanova V.V., Evseev V.A., Sov. Phys. Solid State, 8 (1966), 654.
    Search in Google Scholar
DOI: https://doi.org/10.2478/s13536-011-0008-6 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
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Language: English
Page range: 41 - 46
Published on: Aug 3, 2011
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
multiferroic,
bismuth ferrite,
RF sputtering,
dielectric permittivity,
dielectric loss
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2011 R. Sobiestianskas, B. Vengalis, J. Banys, J. Devenson, A. Oginskis, V. Lisauskas, L. Dapkus, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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