Figure 1
Figure 2
The crystallite size G experimental and correlated at several deposition temperatures_
| Deposition temperature Ts (°C) | Experimental crystallite size (nm) | Fitting crystallite size (nm) |
|---|---|---|
| 380 | 19.13 | 19.14 |
| 400 | 18.74 | 18.84 |
| 420 | 16.88 | 16.96 |
| 440 | 18.31 | 18.45 |
| 460 | 20.72 | 20.82 |
The diffraction angle 2θ, the full width at half-maximum (FWHM), the crystallite size G, the lattice parameter a and a − a0 of (111) diffraction peak for NiO thin films at several deposition temperatures [5]_
| Deposition temperature Ts (°C) | 2θ (deg) | β (rad) | G (nm) | a (nm) | a − a0 (nm) |
|---|---|---|---|---|---|
| 380 | 37.80 | 0.00766 | 19.13 | 0.4122281 | 0.00537184 |
| 400 | 37.67 | 0.00781 | 18.74 | 0.4135872 | 0.00401271 |
| 420 | 37.64 | 0.00868 | 16.88 | 0.4138530 | 0.00374695 |
| 440 | 37.60 | 0.00799 | 18.31 | 0.4143484 | 0.00325152 |
| 460 | 37.66 | 0.00707 | 20.72 | 0.4136507 | 0.00394921 |