Structural, morphological, and optical properties of AgxO thin films deposited via obliquely angle deposition

Structural, morphological, and optical properties of AgxO thin films deposited via obliquely angle deposition

Materials Science-Poland

Volume 41 (2023): Issue 1 (March 2023)

By:

H. Ben Soltane, F. Chaffar Akkari, B. Gallas and M. Kanzari

Open Access

|Jun 2023

Figures & Tables

(A) The schematic diagram of the GLAD technique, and (B) diagram of the self-shadowing effect during the growth of the layer. GLAD, glancing angle deposition

(A) XRD patterns of AgxO thin films deposited, respectively, at γ=0°, 20°, 40°, 60°, 75°, and 85°annealed at 300°C, and (B) XRD patterns of AgxO thin films in the Bragg angles range 35°–40°. XRD, X-ray diffraction

(A) XRD patterns of AgxO thin films deposited, respectively, at γ=0°, 20°, 40°, 60°, 75°, and 85°annealed at 400°C, and (B) XRD patterns of AgxO thin films in the Bragg angles range 35°–40°. XRD, X-ray diffraction

Surface morphology of silver thin film before annealing for the incident angle γ=0°

Surface morphologies of silver oxide thin films after annealing at 300°C for the incident angles a=(γ=0°), b= (γ=40°), c=(γ=60°), d=(γ=75°), and e=(γ=85°)

Surface morphologies of silver oxide thin films after annealing at 400°C for the incident angles a=(γ=0°), b= (γ=40°), c=(γ=60°), d=(γ=75°), and e=(γ=85°)

Cross-section of AgxO thin films deposited at incident angles(A)γ= 60°, (B)γ=75°, and (C)γ=85°

(A) Transmittance spectra and (B) reflectance spectra of AgxO films deposited, respectively, at γ=0°, 20°, 40°, 60°, 75°, and 85° for the annealing temperature in free air of 300°C, for silver thin films

Plot of average reflection for AgxO thin films deposited at different deposition angles (γ=0°, 20°, 40°, 60°, 75°, and 85°) annealed at 300°C and 400°C

The variation of the thickness for the incident angles γ= 40°, 60°, 75°, and 85°for the annealing temperatures (A) 300°C and (B) 400°C

Extinction coefficient spectra of films deposited at incident angles γ=40°, 60°, 75°, and 85°annealed in free air at (A) 300°C and (B) 400°C

Refractive index spectra of films deposited at incident angles γ=40°, 60°, 75°, and 85°annealed in free air at (A) 300°C and (B) 400°C

Δn spectra of films deposited at incident angles γ=40 , 60°, 75°, and 85°annealed in free air at (A) 300°C and (B) 400°C

The variation of the plane birefringence Δn for AgxO thin films deposited at different deposition angles (γ=0°, 20°, 40°, 60°, 75°, and 85°) for the annealing temperature in free air 300°C, for silver thin films

Absorption coefficient spectra of films deposited at incident angles γ=40°, 60°, 75°, and 85°annealed in free air at (A) 300°C and (B) 400°C

Direct band gap energy spectra of films deposited at incident angles γ=40°, 60°, 75°, and 85°annealed in free air at (A) 300°C and (B) 400°C

Different phases, Bragg angles, and reticular planes (hkl) of the samples for the incident angles γ=0°, 20°, 40°, 60°, 75°, and 85°and the incident angles γ=0°, 20°, 40°, and 60° for the annealing temperatures 300°C and 400°C, respectively

Annealing temperature (°C)	Deposition angle γ (°)	Bragg angle 2θ(°)	Phases	(hkl)
300	00	38.1	Ag	(111)
	20	44.3	Ag	(200)
	40	38.1	Ag	(111)
	60	38.2	Ag₂O	(200)
	75	44.3	Ag	(200)
	85	32.2	Ag₂O	(111)
		38.1	Ag	(111)
		38.2	Ag₂O	(200)
		44.3	Ag	(200)
		32.2	Ag₂O	(111)
		38.1	Ag	(111)
		38.2	Ag₂O	(200)
		44.3	Ag	(200)
		32.2	Ag₂O	(111)
		38.2	Ag₂O	(200)
		44.4	Ag	(200)
		32.2	Ag₂O	(111)
		38.2	Ag₂O	(200)
400	00	38.1	Ag	(111)
	20	44.4	Ag	(200)
	40	38.1	Ag	(111)
	60	38.2	Ag₂O	(200)
		44.3	Ag	(200)
		38.1	Ag	(111)
		38.2	Ag₂O	(200)
		44.3	Ag	(200)
		38.1	Ag	(111)
		38.2	Ag₂O	(200)
		44.3	Ag	(200)

Structural data of nanocolumnar silver oxide thin films for the incident angles γ=0°, 20°, 40°, 60°, 75°, and 85°, and with the annealing temperature at 300°C and 400°C

Annealing temperature (°C)	Deposition angleγ(°)	Crystallite size (nm)	Strain ε (×10⁻³)	Dislocation density (δ)(×10⁻³) (nm⁻²)
300	00	36	2.95	0.77
	20	55	1.92	0.33
	40	51	2.09	0.38
	60	54	1.95	0.34
	75	26	3.97	1.47
	85	27	3.90	1.37
400	00	37	2.81	0.73
	20	57	1.96	0.30
	40	51	2.09	0.38
	60	55	1.97	0.32
	75	–	–	–
	85	–	–	–

DOI: https://doi.org/10.2478/msp-2023-0002 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 27 - 41

Submitted on: Oct 17, 2022

Accepted on: Jan 31, 2023

Published on: Jun 12, 2023

Published by: Sciendo

In partnership with: Paradigm Publishing Services

Publication frequency: 4 times per year

Keywords:

obliquely angle deposition,

silver oxide,

nanocolumnar AgO thin films,

structural characterization,

optical analysis,

morphological properties

Related subjects:

Materials sciences,

Materials sciences, other,

Nanomaterials,

Functional and smart materials,

Materials characterization and properties

© 2023 H. Ben Soltane, F. Chaffar Akkari, B. Gallas, M. Kanzari, published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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Structural, morphological, and optical properties of AgxO thin films deposited via obliquely angle deposition

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Different phases, Bragg angles, and reticular planes (hkl) of the samples for the incident angles γ=0°, 20°, 40°, 60°, 75°, and 85°and the incident angles γ=0°, 20°, 40°, and 60° for the annealing temperatures 300°C and 400°C, respectively

Structural data of nanocolumnar silver oxide thin films for the incident angles γ=0°, 20°, 40°, 60°, 75°, and 85°, and with the annealing temperature at 300°C and 400°C

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