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Effect of thermal annealing on structural and optical properties of In doped Ge-Se-Te chalcogenide thin films

Open Access
|Dec 2019

Authors

Pravin Kumar Singh

Amorphous Semiconductor Research Lab, Department of Applied Science, Madan Mohan Malaviya University of Technology, Gorakhpur, India

S.K. Tripathi

Department of Physics, Punjab University, Chandigarh, India

D.K. Dwivedi

todkdwivedi@gmail.com

Amorphous Semiconductor Research Lab, Department of Applied Science, Madan Mohan Malaviya University of Technology, Gorakhpur, India
DOI: https://doi.org/10.2478/msp-2019-0061 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 554 - 562
Submitted on: Feb 19, 2018
Accepted on: Mar 1, 2019
Published on: Dec 30, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 times per year

© 2019 Pravin Kumar Singh, S.K. Tripathi, D.K. Dwivedi, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.