Abstract
This study investigates the formation of zinc oxide (ZnO) layers on zinc substrates under various environmental conditions and their characterization. Zinc samples were subjected to controlled exposure regimes including aqueous solutions and water vapour environments to stimulate the formation of ZnO. The resulting layers were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM/EDS), and optical microscopy. The analysis reveals correlations between exposure parameters and layer morphology, thickness, and phase composition. The study identifies key factors affecting ZnO layer quality and proposes pathways for optimizing these layers for potential sensing applications.