Comparative analysis of surface layer functionality in STM and AFM probes: Effects of coating on emission characteristics
By:
References
- G. Binnig, H. Rohrer, C. Gerber, and E. Weibel. “Surface studies by scanning tunneling microscopy”. Phys. Rev. Lett. 49, 57–61, 1982.
- G. Binning, and H. Rohrer, “Scanning tunneling microscopy”. Surf. Sci. 126, 236–244, 1983.
- G. Binnig, and H. Rohrer. “Scanning Tunneling Microscopy–From Birth to Adolescence”. Rev. Mod. Phys. 59, 615−625, 1987.
- C. Gerber, G. Binnig, H. Fuchs, O. Marti, and H. Rohrer. “Scanning tunneling microscope combined with a scanning electron-microscope”. Rev. Sci. Instrum. 57, 221–224, 1986.
- H.-J. Güntherodt R. Wiesendanger, “Scanning tunneling microscopy I”. First edition, Springer series in Surface Science, Springer-Verlag, Berlin, Germany, 1992.
- H.-J. Güntherodt R. Wiesendanger, “Scanning tunneling microscopy II”. First edition, Springer series in Surface Science, Springer-Verlag, Berlin, Germany, 1992.
- K. Besocke. “An easily operable scanning tunneling microscope”. Surf. Sci. 181, 145–153, 1987.
- M. Salmeron, and B. Eren, “High-Pressure Scanning Tunneling Microscopy”. Chem. Rev. 121(2), 962-1006, 2021.
- B. J. McIntyre, M. Salmeron, and G. A. Somorjai, “A Variable Pressure/Temperature Scanning Tunneling Microscope for SurfaceScience and Catalysis Studies”. Rev. Sci. Instrum. 64, 687−691, 1993.
- T. Tiedje, J. Varon, H. Deckman, and J. Stokes. “Tip contamination effects in ambient pressure scanning tunneling microscopy imaging of graphite”. J. Vac. Sci. Technol. A 6(2), 372-375, 1987.
- K. Bian, C. Gerber, A. J. Heinrich, D. J. Müller, S. Scheuring, and Y. Jiang. “Scanning probe microscopy”. Nat. Rev. Methods Primers 1, 36, 2021.
- Y. Martin, C. C. Williams, and H. K. Wickramasinghe. “Atomic force microscope force mapping and profiling on a sub 100-Å scale”. J. Appl. Phys. 61, 4723–4729, 1987.
- Y. F. Dufrêne, T. Ando, R. Garcia, D. Alsteens, D. Martinez-Martin, A. Engel, C. Gerber, and D. J. Müller. “Imaging modes of atomic force microscopy for application in molecular and cell biology”. Nat. Nanotechnol. 12, 295–307, 2017.
- D. J. Müller, A. C. Dumitru, C. Lo Giudice, H. E. Gaub, P. Hinterdorfer, G. Hummer, J. J. De Yoreo, Y. F. Dufrêne, and D. Alsteens. “Atomic Force Microscopy-Based Force Spectroscopy and Multiparametric Imaging of Biomolecular and Cellular Systems”. Chem. Rev. 121(19), 11701–11725, 2021.
- R. Garcıá, and Rubén Pérez. "Dynamic atomic force microscopy methods". Surf. Sci. Rep. 47(6-8), 197-301, 2002.
- F. J. Giessibl. “Advances in atomic force microscopy”. Rev. Mod. Phys. 75, 949, 2003.
- L. W. Francis, P. D. Lewis, C. J. Wright, and R. S. Conlan. “Atomic force microscopy comes of age”. Biology of the Cell 102, 133-143, 2010.
- R. G. Forbes. “Development of a simple quantitative test for lack of field emission orthodoxy” Proc. R. Soc. Lond. A 469, 2013.
- R. G. Forbes. “The Murphy–Good plot: a better method of analysing field emission data”. R. Soc. Open Sci. 6, 2019.
- R. G. Forbes, E. O. Popov, A. G. Kolosko, and S. V. Filippov. “The pre-exponential voltage-exponent as a sensitive test parameter for field emission theories”. Roy. Soc. Open Sci. 8, 2021.
- M. M. Allaham, R. G. Forbes, A. Knápek, D. Sobola, D. Burda, P. Sedlák, M. S. Mousa, Interpretation of field emission current–voltage data: Background theory and detailed simulation testing of a user-friendly webtool, Mat. Tod. Comm., 31, 2022.
- M. M. Allaham, R. G. Forbes, A. Knapek, and M. S. Mousa. “Implementation of the orthodoxy test as a validity check on experimental field emission data”. J. Electr. Eng. 71 (1), 37–42, 2020.
- M. M. Allaham, A. Knápek, M. S. Mousa and R. G. Forbes. “User-friendly method for testing field electron emission data: Technical report”. 2021 34th International Vacuum Nano-electronics Conference (IVNC), Lyon, France 2021, 1-2.
- [24] Z. Košelová, L. Horáková, D. Burda, M. M. Allaham, A. Knápek, Z. Fohlerová. “Cleaning of tungsten tips for subsequent use as cold field emitters or STM probes”, J. Elect. Eng. 75 (1), 41–46, 2024.
- A. Knápek, M. M. Allaham, D. Burda, D. Sobola, M. Drozd, M. Horáček. “Explanation of the quasi-harmonic field emission behaviour observed on epoxy-coated polymer graphite cathodes”. Mat. Tod. Comm 34, 2023.
- E. O. Popov, S. V. Filippov, A. G. Kolosko, and A. Knápek. “Comparison of the effective parameters of single-tip tungsten emitter using Fowler–Nordheim and Murphy–Good plots”. J. Vac. Sci. Technol. B 40 (2), 2022.
- “Electrical conductivity of silicon.”
http://lampz.tugraz.at/~hadley/psd/L4/conductivity.php (accessed Jun. 06, 2024). - N. D. Arora, J. R. Hauser, and D. J. Roulston, “Electron and Hole Mobilities in Silicon as a Function of Concentration and Temperature,”
IEEE Trans. Electron Devices , vol. 29, no. 2, pp. 292–295, 1982. - G. N. Fursey, “Field emission in vacuum micro-electronics,”
Appl. Surf. Sci. , vol. 215, no. 1–4, pp. 113–134, Jun. 2003.
Language: English
Page range: 268 - 274
Submitted on: Apr 2, 2024
Published on: Aug 9, 2024
Published by: Slovak University of Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 6 times per year
Keywords:
Related subjects:
© 2024 Alexandr Knápek, Mohammad M. Allaham, Zuzana Košelová, Daniel Burda, Jáchym Podstránský, Marwan S. Mousa, Dinara Sobola, published by Slovak University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.