Have a personal or library account? Click to login
Automatic test-bench for SiC power devices using LabVIEW Cover

Automatic test-bench for SiC power devices using LabVIEW

Journal of Electrical Engineering
Volume 75 (2024): Issue 2 (April 2024)
By: Jan Leuchter,  Ngoc Nam Pham and  Huy Hoang Nguyen  
Open Access
|Apr 2024

Authors

Jan Leuchter

jan.leuchter@vut.cz

Department of Microelectronics, Brno University of Technology, Brno, Czech Republic
Faculty of Transport Engineering, University of Pardubice, Pardubice, Czech Republic

Ngoc Nam Pham

243756@vut.cz

Institute of System Integration, Le Quy Don Technical University, Hanoi, Vietnam

Huy Hoang Nguyen

huyhoangvtdt686@gmail.com

Institute of System Integration, Le Quy Don Technical University, Hanoi, Vietnam
DOI: https://doi.org/10.2478/jee-2024-0011 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Journal RSS Feed
Language: English
Page range: 77 - 85
Submitted on: Jan 16, 2024
|
Published on: Apr 4, 2024
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
power electronic devices,
SiC,
LabVIEW,
PSpice,
Spice model
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2024 Jan Leuchter, Ngoc Nam Pham, Huy Hoang Nguyen, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Volume 75 (2024): Issue 2 (April 2024)Next article