Automatic test-bench for SiC power devices using LabVIEW
By: Jan Leuchter, Ngoc Nam Pham and Huy Hoang Nguyen
Authors
Jan Leuchter
Department of Microelectronics, Brno University of Technology, Brno, Czech Republic
Faculty of Transport Engineering, University of Pardubice, Pardubice, Czech Republic
Ngoc Nam Pham
Institute of System Integration, Le Quy Don Technical University, Hanoi, Vietnam
Huy Hoang Nguyen
Institute of System Integration, Le Quy Don Technical University, Hanoi, Vietnam
Language: English
Page range: 77 - 85
Submitted on: Jan 16, 2024
Published on: Apr 4, 2024
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
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© 2024 Jan Leuchter, Ngoc Nam Pham, Huy Hoang Nguyen, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.