Authors
Lei Tian
School of Electronic Engineering, Xi’an University of Posts and Telecommunications, Xi’an, China
Zhong Chen
Department of Electrical Engineering, University of Arkansas, Arkansas, USA
Qinqin Li
School of Electronic Engineering, Xi’an University of Posts and Telecommunications, Xi’an, China
Weiheng Wang
Institution Sup Galil´ ee, Universit´ e Paris 13, France