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Structural and optical characterization of Cu doped ZnO thin films deposited by RF magnetron sputtering Cover

Structural and optical characterization of Cu doped ZnO thin films deposited by RF magnetron sputtering

Journal of Electrical Engineering
Volume 70 (2019): Issue 7 (December 2019)
By: Maria Toma,  Nicolae Ursulean,  Daniel Marconi and  Aurel Pop  
Open Access
|Sep 2019
Articles in this issue
DOI: https://doi.org/10.2478/jee-2019-0054 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 127 - 131
Submitted on: Mar 19, 2019
Published on: Sep 28, 2019
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
Cu doped ZnO,
thin films,
RF magnetron sputtering,
XRD,
optical properties
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2019 Maria Toma, Nicolae Ursulean, Daniel Marconi, Aurel Pop, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Volume 70 (2019): Issue 7 (December 2019)
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