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Condition monitoring and deterioration analysis of metal oxide varistor Cover

Condition monitoring and deterioration analysis of metal oxide varistor

Journal of Electrical Engineering
Volume 69 (2018): Issue 5 (September 2018)
By: Guoming Wang,  Woo-Hyun Kim,  Jong-Hyuk Lee and  Gyung-Suk Kil  
Open Access
|Dec 2018

Authors

Guoming Wang

Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University, Busan

Woo-Hyun Kim

Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University, Busan

Jong-Hyuk Lee

jhlee5@lsis.biz

HVDC Production Team, LSIS Co., Ltd, Busan

Gyung-Suk Kil

kilgs@kmou.ac.kr

Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University, Busan
DOI: https://doi.org/10.2478/jee-2018-0051 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 352 - 358
Submitted on: Jul 29, 2017
|
Published on: Dec 14, 2018
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
metal-oxide varistor,
thermal protected metal-oxide arrester,
condition monitoring,
deterioration analysis,
accelerated aging test
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2018 Guoming Wang, Woo-Hyun Kim, Jong-Hyuk Lee, Gyung-Suk Kil, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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