Condition monitoring and deterioration analysis of metal oxide varistor
By: Guoming Wang, Woo-Hyun Kim, Jong-Hyuk Lee and Gyung-Suk Kil
Authors
Guoming Wang
Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University, Busan
Woo-Hyun Kim
Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University, Busan
Gyung-Suk Kil
Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University, Busan
Language: English
Page range: 352 - 358
Submitted on: Jul 29, 2017
Published on: Dec 14, 2018
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
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© 2018 Guoming Wang, Woo-Hyun Kim, Jong-Hyuk Lee, Gyung-Suk Kil, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.